IP Library Granted Patent US 6,933,490
Granted Patent B1
US 6,933,490 · App. 10/019,675 · Granted Aug 23, 2005

Method and device for fiber-optical measuring systems

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Quick Facts
Patent No.
US 6,933,490
App. No.
10/019,675
Granted
Aug 23, 2005
Kind
B1
Abstract

The invention relates to a method for optical measuring systems, comprising a sensor element ( 6 ) connected to a measuring and control unit ( 10 ) via an optical connection ( 3 ), and being adapted for providing a signal defining a measurement of a physical parameter (p) influencing the sensor element ( 6 ), said method comprising generation of a measuring signal that is brought to come in towards the sensor element ( 6 ), and detection of the intensity of the measuring signal (B) in the measuring and control unit ( 10 ), after influencing the measuring signal in the sensor element ( 6 ). The invention is characterised by comprising partial reflection of the measuring signal at a point along the optical connection ( 3 ), at a predetermined distance from the sensor element ( 6 ), detection of the intensity of the signal (A), corresponding to said partially reflected measuring signal, and determination of a measurement of said parameter (p) based upon the intensity of the partially reflected signal (A) and the intensity of the measuring signal (B). The invention also relates to a device for carrying out said method. Through the invention, measurements with an optical pressure measuring system are allowed, which exhibit effective compensation for any existing sources of error.

Claims (26)

1. A method for optical measuring systems, comprising a sensor element connected to a measuring and control unit via one single optical fiber and being adapted for providing a signal corresponding to a measurement of a physical parameter influencing the sensor element, said method comprising the steps of:

generation of a measuring signal that is brought to come in towards the sensor element, and

detection of said measuring signal in the measuring and control unit by a single detector, after influencing the measuring signal in the sensor element,

partial reflection of the measuring signal at a point along the one single optical fiber, located at a predetermined distance from the sensor element,

detection of the intensity of the signal corresponding to said partially reflected measuring signal by said single detector, and

determination of a measurement of said parameter based upon the intensity of the partially reflected signal and the intensity of the measuring signal.

2. The method according to claim 1 , characterized by comprising:

determination of a value corresponding to the quotient of the intensity of said reflected signal and the intensity of said measuring signal, and

determination of a measurement of said parameter based upon said quotient.

3. The method according to claim 1 , characterized by comprising:

determination of a value corresponding to the difference between the intensity of said reflected signal and the intensity of said measuring signal, and

determination of a measurement of said parameter based upon said difference.

4. A method according to claim 1 , characterized by said measuring signal being a light pulse.

5. A method according to claim 1 , characterized by the feeding of the measuring signal into the sensor element causing optical interference in a cavity of the sensor element.

6. A method according to claim 1 , characterized by being used for measuring pressure, said sensor element defining a membrane, acted upon by the pressure surrounding the sensor element.

7. A method according to claim 1 , characterized by being used for measuring the acceleration or the temperature of said sensor element.

8. A device for optical measuring systems, comprising:

a sensor element connected to a measuring and control unit via one single optical fiber and being adapted for providing a signal corresponding to a measurement of a physical parameter influencing the sensor element,

a light source functioning to generate a measuring signal brought to come in towards the sensor element,

a detector for detecting the intensity of the measuring signal in the measuring and control unit, after influencing the measuring signal in the sensor element,

a semi-reflecting device for partial reflection of the measuring signal at a point along the one single optical fiber at a predetermined distance from the sensor element,

said detector being arranged for detection of the intensity of the signal corresponding to said partially reflected measuring signal, and

an evaluation unit for determining a measurement of said parameter, based upon the intensity of the partially reflected signal and the intensity of the measuring signal from said detector.

9. The device according to claim 8 , characterized by said sensor element comprising a cavity, shaped so as to create optical interference when feeding said measuring signal into the cavity.

10. The device according to claim 9 , characterized by said cavity being obtained through building up molecular silicone and/or silicone dioxide layers, and an etching procedure.

11. The device according to claim 10 , characterized by said cavity being obtained through utilizing a bonding procedure.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Mar 5, 2021
From: SILICON VALLEY BANK
To: DURHAM GEO-ENTERPRISES INC.; ROCTEST LTD.; NOVA METRIX (LUXEMBOURG) S.A.R.L.; NOVA METRIX CORPORATION; NOVA METRIX (CANADA) CORP.; FISO TECHNOLOGIES INC.; SENSORNET LIMITED
Reel/Frame 055506/0708 →
RELEASE OF SECURITY INTEREST Recorded Feb 23, 2021
From: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
To: DURHAM GEO-ENTERPRISES INC.; ROCTEST LTD.; NOVA METRIX (LUXEMBOURG) S.A.R.L.; NOVA METRIX CORPORATION; NOVA METRIX (CANADA) CORP.; FISO TECHNOLOGIES INC.; SENSORNET LIMITED
Reel/Frame 055376/0119 →
THIRD AMENDMENT TO PATENT SECURITY AGREEMENT Recorded Dec 1, 2017
From: DURHAM GEO-ENTERPRISES INC.; ROCTEST LTD.
To: SILICON VALLEY BANK
Reel/Frame 044592/0340 →
SECURITY AGREEMENT Recorded Feb 22, 2013
From: DURHAM GEO-ENTERPRISES INC.; ROCTEST LTD.; NOVA METRIX (LUXEMBOURG) S.A.R.L.; NOVA METRIX CORPORATION; NOVA METRIX (CANADA) CORP.; FISO TECHNOLOGIES INC.; SENSORNET LIMITED
To: SILICON VALLEY BANK
Reel/Frame 029855/0271 →
COURT APPOINTMENT OF TRUSTEE Recorded Jan 17, 2013
From: GOTEBORGS TINGSRATT (DISTRICT COURT OF GOTHENBURG)
To: ZDROJEWSKI (AS TRUSTEE IN BANKRUPCTY OF SAMBA SENSORS AB), MAREK, MR.
Reel/Frame 029649/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2013
From: THE BANKRUPTCY ESTATE OF SAMBA SENSORS AB (AS REPRESENTED BY MAREK ZDROJEWSKI, TRUSTEE IN BANKRUPTCY)
To: FISO TECHNOLOGIES INC.
Reel/Frame 029649/0332 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2002
From: VIDOVIC, NEVIO; KRANTZ, MARTIN; HOJER, SVANTE; JOSEFSSON, THORLEIF
To: SAMBA SENSORS AB
Reel/Frame 012952/0390 →