Patent Application
Utility
App. No. 10/025,972
· Confirmation No. 7826
SENSOR UTILIZING ATTENUATED TOTAL REFLECTION
Inventor:
Masayuki Naya
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-04-09 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-02-06 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-02-06 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-02-06 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-02-06 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-02-06 | FWCLM |
Index of Claims | 1 | View | |
| 2003-11-28 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 2 | View | |
| 2003-11-28 | REM |
Applicant Arguments/Remarks Made in an Amendment | 5 | View | |
| 2003-08-28 | CTNF |
Non-Final Rejection | 6 | View | |
| 2003-08-28 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-08-12 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2003-06-23 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-06-23 | REM |
Applicant Arguments/Remarks Made in an Amendment | 3 | View | |
| 2003-03-21 | CTNF |
Non-Final Rejection | 5 | View | |
| 2003-03-21 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-03-21 | 1449 |
List of References cited by applicant and considered by examiner | 2 | View | |
| 2002-07-11 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2002-07-11 | FOR |
Foreign Reference | 25 | View | |
| 2002-07-11 | FOR |
Foreign Reference | 46 | View | |
| 2002-07-11 | FOR |
Foreign Reference | 6 | View | |
| 2002-03-07 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2002-03-07 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-03-07 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2002-03-07 | FOR |
Foreign Reference | 11 | View | |
| 2002-01-30 | CTMS |
Miscellaneous Action with shortened statutory period (SSP) | 1 | View | |
| 2001-12-26 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-12-26 | SPEC |
Specification | 28 | View | |
| 2001-12-26 | CLM |
Claims | 3 | View | |
| 2001-12-26 | ABST |
Abstract | 1 | View | |
| 2001-12-26 | DRW |
Drawings-only black and white line drawings | 8 | View | |
| 2001-12-26 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2001-12-26 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2001-12-26 | FWCLM |
Index of Claims | 1 | View | |
| 2001-12-26 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-12-26 | DRW |
Drawings-only black and white line drawings | 8 | View | |
| 2001-12-26 | SPEC |
Specification | 28 | View | |
| 2001-12-26 | CLM |
Claims | 3 | View | |
| 2001-12-26 | ABST |
Abstract | 1 | View | |
| 2001-12-26 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-12-26 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2001-12-26 | FRPR |
Certified Copy of Foreign Priority Application | 29 | View |
Inventors
Masayuki Naya
Kaisei-machi, JAPAN
Attorneys & Agents of Record
Classification
USPC
356/445
G01N21/553
Prosecution
- Examiner
- STAFIRA, MICHAEL PATRICK
- Art Unit
- 2877
- Docket No.
- Q66572
- Confirmation No.
- 7826
Foreign Priority
392956/2000
·
2000-12-25
·
JAPAN
Publication
- Pub. No.
- US20020085203A1
- Pub. Date
- 2002-07-04
Patent Term Adjustment
-2days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2007-02-15
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Quick Facts
- App. No.
- 10/025,972
- Filed
- 2001-12-26
- Granted
- 2004-05-25
- Pub. No.
- US20020085203A1
- Examiner
- STAFIRA, MICHAEL PATRICK
- Art Unit
- 2877
- PTA
- -2 days
External Links