Patent Application
Utility
App. No. 10/058,028
· Confirmation No. 2676
PHOTOTHERMOGRAPHIC MATERIAL
Inventor:
Tokuju Oikawa
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-10-27 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-07-28 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-07-28 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-07-28 | FWCLM |
Index of Claims | 1 | View | |
| 2004-07-28 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-07-28 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-07-07 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-07-07 | FWCLM |
Index of Claims | 1 | View | |
| 2004-06-10 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 3 | View | |
| 2004-06-10 | CLM |
Claims | 6 | View | |
| 2004-06-10 | REM |
Applicant Arguments/Remarks Made in an Amendment | 7 | View | |
| 2004-06-10 | REM |
Applicant Arguments/Remarks Made in an Amendment | 18 | View | |
| 2004-03-10 | CTNF |
Non-Final Rejection | 7 | View | |
| 2004-03-10 | FWCLM |
Index of Claims | 1 | View | |
| 2004-03-10 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-02-02 | AMSB |
Amendment Submitted/Entered with Filing of Continued Prosecution Application (CPA)/Request for Continued Examination(RCE) | 3 | View | |
| 2004-02-02 | CLM |
Claims | 6 | View | |
| 2004-02-02 | REM |
Applicant Arguments/Remarks Made in an Amendment | 6 | View | |
| 2004-02-02 | AF/D |
Affidavit-submitted prior to Mar 15, 2013 | 5 | View | |
| 2004-01-15 | EXIN |
Examiner Interview Summary Record (PTOL - 413) | 2 | View | |
| 2003-12-29 | RCEX |
Request for Continued Examination (RCE) | 3 | View | |
| 2003-11-25 | CTAV |
Advisory Action (PTOL-303) | 3 | View | |
| 2003-11-04 | A.NE |
Response After Final Action | 1 | View | |
| 2003-11-04 | CLM |
Claims | 6 | View | |
| 2003-11-04 | REM |
Applicant Arguments/Remarks Made in an Amendment | 7 | View | |
| 2003-11-04 | N/AP |
Notice of Appeal Filed | 2 | View | |
| 2003-11-04 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2003-11-04 | OATH |
Oath or Declaration filed | 6 | View | |
| 2003-05-05 | CTFR |
Final Rejection | 7 | View | |
| 2003-03-06 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2003-03-06 | AF/D |
Affidavit-submitted prior to Mar 15, 2013 | 7 | View | |
| 2003-03-04 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-03-04 | CLM |
Claims | 2 | View | |
| 2003-03-04 | REM |
Applicant Arguments/Remarks Made in an Amendment | 8 | View | |
| 2003-03-04 | AF/D |
Affidavit-submitted prior to Mar 15, 2013 | 7 | View | |
| 2003-03-04 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2002-12-04 | CTNF |
Non-Final Rejection | 6 | View | |
| 2002-12-04 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2002-12-04 | 892 |
List of references cited by examiner | 1 | View | |
| 2002-12-04 | FOR |
Foreign Reference | 36 | View | |
| 2002-04-22 | LET. |
Miscellaneous Incoming Letter | 5 | View | |
| 2002-04-22 | OATH |
Oath or Declaration filed | 2 | View | |
| 2002-02-21 | PEFN |
Pre-Exam Formalities Notice | 1 | View | |
| 2002-01-29 | TRNA |
Transmittal of New Application | 3 | View | |
| 2002-01-29 | SPEC |
Specification | 150 | View | |
| 2002-01-29 | CLM |
Claims | 4 | View | |
| 2002-01-29 | ABST |
Abstract | 1 | View | |
| 2002-01-29 | DRW |
Drawings-only black and white line drawings | 2 | View | |
| 2002-01-29 | OATH |
Oath or Declaration filed | 1 | View | |
| 2002-01-29 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2002-01-29 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2002-01-29 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2002-01-29 | FWCLM |
Index of Claims | 1 | View | |
| 2002-01-29 | TRNA |
Transmittal of New Application | 4 | View | |
| 2002-01-29 | DRW |
Drawings-only black and white line drawings | 2 | View | |
| 2002-01-29 | SPEC |
Specification | 150 | View | |
| 2002-01-29 | CLM |
Claims | 4 | View | |
| 2002-01-29 | ABST |
Abstract | 1 | View | |
| 2002-01-29 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-01-29 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-01-29 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2002-01-29 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2002-01-29 | FOR |
Foreign Reference | 37 | View | |
| 2002-01-29 | FRPR |
Certified Copy of Foreign Priority Application | 149 | View | |
| 2002-01-29 | FRPR |
Certified Copy of Foreign Priority Application | 143 | View |
Inventors
Tokuju Oikawa
Minami-ashigara-shi, JAPAN
Attorneys & Agents of Record
Classification
USPC
430/350
G03C1/49845
G03C1/09
G03C1/49818
G03C1/49881
G03C2001/03594
G03C2001/091
G03C2001/096
G03C2200/09
G03C2200/39
Prosecution
- Examiner
- CHEA, THORL
- Art Unit
- 1752
- Customer No.
- 2292
- Docket No.
- 2870-0179P
- Confirmation No.
- 2676
Foreign Priority
021749/2001
·
2001-01-30
·
JAPAN
021750/2001
·
2001-01-30
·
JAPAN
Publication
- Pub. No.
- US20030068586A1
- Pub. Date
- 2003-04-10
Patent Term Adjustment
-91days
No related applications found.
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Quick Facts
- App. No.
- 10/058,028
- Filed
- 2002-01-29
- Granted
- 2004-11-30
- Pub. No.
- US20030068586A1
- Examiner
- CHEA, THORL
- Art Unit
- 1752
- PTA
- -91 days
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