IP Library Granted Patent US 6,864,980
Granted Patent B2
US 6,864,980 · App. 10/060,096 · Granted Mar 8, 2005

Linear filter based wavelength locking optical sub-assembly and associated methods

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Quick Facts
Patent No.
US 6,864,980
App. No.
10/060,096
Granted
Mar 8, 2005
Kind
B2
Abstract

A wavelength detector includes a beam splitter block that taps off two spatially separated beams and a linear filter in an optical path of one of the two beams. The linear filter may be provided on the beam splitter block. The linear filter may be a notch anti-reflective filter in the optical path of the application beam. One or both of the beams may be focused on to their respective detectors.

Claims (25)

1. A wavelength detector comprising:

a beam splitter block having first and second surfaces, the beam splitter block receiving an input beam, tapping off first and second beams that are spatially separated from one another, the first and second beams being output from the first surface, and outputting a third beam from the second surface to proceed to an application;

an optical element on the beam splitter block providing a further optical function to at least one of the first and second beams, each of the first and second surfaces of the beam splitter block providing at least one of the tapping and the further optical function to at least one of the first and second beams;

a linear filter in an optical path of one of the first and second beams to form a filter beam, the one of the first and second beams not filtered by the linear filter serving as a reference beam, the linear filter having a wavelength dependent response;

a first detector receiving the filter beam; and

a second detector receiving the reference beam.

2. The wavelength detector of claim 1 , wherein the optical element on the beam splitter block is a focusing element.

3. The wavelength detector of claim 1 , wherein the optical element on the beam splitter block is the linear filter.

4. The wavelength detector of claim 3 , wherein the linear filter is on the second surface and the third beam passes through the linear filter.

5. The wavelength detector of claim 1 , further comprising a focusing element that focuses both the filter beam and the reference beam.

6. The wavelength detector of claim 1 , further comprising a focusing element focusing the reference beam on the second detector.

7. The wavelength detector of claim 1 , wherein the linear filter is a notch filter.

8. The wavelength detector of claim 1 , wherein the beam splitter block splits off the first beam at the first surface and the second beam at the second surface.

9. The wavelength detector of claim 1 , wherein the first and second detectors are in the same plane.

10. The wavelength detector of claim 1 , further comprising a mount supporting the first and second detectors.

11. The wavelength detector of claim 1 , wherein the first and second beam are tapped off the input beam at the second surface and are separated by a diffractive splitter at the first surface.

12. The wavelength detector of claim 1 , further comprising a focusing element in an optical path of the filter beam.

13. The wavelength detector of claim 1 , wherein the reference beam is reflected by the linear filter and directed onto the second detector.

14. The wavelength detector of claim 1 , wherein the linear filter is in an optical path of the third beam.

15. The wavelength detector of claim 14 , wherein the linear filter is on the splitter block.

16. The wavelength detector of claim 14 , wherein the linear filter is a notch anti-reflective filter.

17. The wavelength detector of claim 1 , wherein the optical element on the splitter block is an anti-reflective coating.

18. The wavelength detector of claim 1 , wherein the linear filter is on the splitter block.

19. The wavelength detector of claim 1 , wherein the linear filter is a notch anti-reflective filter.

20. The wavelength detector of claim 1 , wherein the filter beam passes through the linear filter.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE PATENT NO. 7817833 PREVIOUSLY RECORDED AT REEL: 027768 FRAME: 0541. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Oct 1, 2015
From: TESSERA NORTH AMERICA, INC.
To: DIGITALOPTICS CORPORATION EAST
Reel/Frame 036733/0896 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2015
From: DIGITALOPTICS CORPORATION; DIGITALOPTICS CORPORATION MEMS; FOTONATION LIMITED
To: NAN CHANG O-FILM OPTOELECTRONICS TECHNOLOGY LTD
Reel/Frame 034883/0237 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2014
From: DIGITALOPTICS CORPORATION EAST
To: DIGITALOPTICS CORPORATION
Reel/Frame 031965/0905 →
CHANGE OF NAME Recorded Feb 27, 2012
From: TESSERA NORTH AMERICA, INC.
To: DIGITALOPTICS CORPORATION EAST
Reel/Frame 027768/0541 →