IP Library › Granted Patent US 6,765,403
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US 6,765,403 · Confirmation No. 7031

TEST CIRCUIT AND TEST METHOD FOR PROTECTING AN IC AGAINST DAMAGE FROM ACTIVATION OF TOO MANY CURRENT DRAWING CIRCUITS AT ONE TIME

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Quick Facts
Patent No.
US 6,765,403
App. No.
10/067,206
Filed
2002-02-05
Granted
2004-07-20
Pub. No.
US20020149387A1
Art Unit
2829
PTA
-87 days