IP Library › Granted Patent US 6,673,639
Granted Patent Utility
US 6,673,639 · Confirmation No. 5102

METHOD AND SYSTEM FOR EVALUATING POLSILICON, AND METHOD AND SYSTEM FOR FABRICATING THIN FILM TRANSISTOR

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2007-10-23 EBCC.AD Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update 1 View
2003-09-29 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-09-29 LET. Miscellaneous Incoming Letter 1 View
2003-04-17 C.AD Change of Address 1 View
2002-02-12 TRNA Transmittal of New Application 2 View
2002-02-12 ADS Application Data Sheet 2 View
2002-02-12 SPEC Specification 47 View
2002-02-12 CLM Claims 7 View
2002-02-12 ABST Abstract 1 View
2002-02-12 DRW Drawings-only black and white line drawings 19 View
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Quick Facts
Patent No.
US 6,673,639
App. No.
10/072,997
Filed
2002-02-12
Granted
2004-01-06
Pub. No.
US20020160586A1
Art Unit
2822
PTA
0 days