Patent Application
Utility
App. No. 10/077,673
· Confirmation No. 3013
WAVELENGTH MEASUREMENT APPARATUS
Inventor:
Seiji Funakawa
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-08-09 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-08-09 | LET. |
Miscellaneous Incoming Letter | 3 | View | |
| 2004-05-07 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 6 | View | |
| 2004-05-07 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-05-07 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-05-07 | FWCLM |
Index of Claims | 1 | View | |
| 2004-04-28 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-04-16 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-04-16 | CLM |
Claims | 5 | View | |
| 2004-04-16 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2004-04-16 | XT/ |
Extension of Time | 1 | View | |
| 2004-01-02 | CTNF |
Non-Final Rejection | 12 | View | |
| 2004-01-02 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-01-02 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-01-02 | FWCLM |
Index of Claims | 1 | View | |
| 2004-01-02 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-12-28 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2002-07-02 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2002-05-28 | PEFR |
Applicant Response to Pre-Exam Formalities Notice | 3 | View | |
| 2002-05-28 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-03-18 | PEFN |
Pre-Exam Formalities Notice | 1 | View | |
| 2002-02-15 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-02-15 | SPEC |
Specification | 59 | View | |
| 2002-02-15 | CLM |
Claims | 7 | View | |
| 2002-02-15 | ABST |
Abstract | 1 | View | |
| 2002-02-15 | DRW |
Drawings-only black and white line drawings | 10 | View | |
| 2002-02-15 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2002-02-15 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-02-15 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-02-15 | FRPR |
Certified Copy of Foreign Priority Application | 34 | View | |
| 2002-02-15 | FRPR |
Certified Copy of Foreign Priority Application | 32 | View |
Inventors
Seiji Funakawa
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
356/519
G01J3/06
Prosecution
- Examiner
- LEE, HWA S
- Art Unit
- 2877
- Customer No.
- 26211
- Docket No.
- 10830-089001 /A36-140857M
- Confirmation No.
- 3013
Foreign Priority
P. 2001-038841
·
2001-02-15
·
JAPAN
P. 2001-065360
·
2001-03-08
·
JAPAN
Publication
- Pub. No.
- US20020130252A1
- Pub. Date
- 2002-09-19
Patent Term Adjustment
-58days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2005-04-06
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Quick Facts
- App. No.
- 10/077,673
- Filed
- 2002-02-15
- Granted
- 2004-09-21
- Pub. No.
- US20020130252A1
- Examiner
- LEE, HWA S
- Art Unit
- 2877
- PTA
- -58 days
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