Apparatus and method for testing subscriber loop interface circuits
View Patent ↗A method and apparatus for internally testing portions of a subscriber loop interface circuit. Testing may be conducted on a semiconductor circuit including the subscriber loop interface circuit. The portion of the subscriber loop interface circuit being tested may be the ring trip detector and/or the off-hook detect circuit. Testing may be conducted without disabling the capability of the subscriber loop interface circuit to monitor the hook status of a subscriber.
1. In a semiconductor integrated circuit having a subscriber loop interface circuit that includes a ring trip detector and an off-hook detect circuit, the improvement comprising first and second testing means operatively connected to test the ring trip detector and the off-hook detect circuits without disabling the monitoring of the off-hook status of a subscriber terminal device, wherein said off-hook detect circuit is responsive to (a) a signal having a first predetermined characteristic for indicating the presence of a test signal, and (b) a second predetermined characteristic for indicating the presence of an off-hook signal and aborting a test of the ring trip detector or the off-hook detect circuits in response thereto.
2. The circuit of claim 1 wherein the characteristic of the first signal and the characteristic of the second signal are the same, and wherein the value of the second characteristic is higher than the value of the first characteristic.
3. The circuit of claim 1 wherein said first and second testing means is capable of simultaneously testing the ring trip detector and the off-hook detect circuit while actively monitoring the off-hook status of a subscriber terminal device.
4. The circuit of claim 3 wherein said internal testing means distinguishes between signals of two different thresholds.
5. The circuit of claim 4 wherein said internal testing means does not interfere with the detection of an off-hook signal.