IP Library Granted Patent US 6,888,873
Granted Patent B2
US 6,888,873 · App. 10/078,422 · Granted May 3, 2005

Long wavelength VCSEL bottom mirror

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Quick Facts
Patent No.
US 6,888,873
App. No.
10/078,422
Granted
May 3, 2005
Kind
B2
Abstract

A vertical cavity surface emitting laser having an InP substrate and a lower mirror stack comprised of a plurality of alternating layers of AlPSb and GaPSb over the InP substrate. An InP spacer is over the lower mirror stack. An active region is over the InP spacer, and a tunnel junction is over the active region. Then a top mirror structure comprised of a low-temperature formed first GaAs buffer layer, a high-temperature formed second GaAs seed layer, an insulating structure having an opening, and a GaAs/Al(Ga)As mirror stack that is grown by lateral epitaxial overgrowth.

Claims (38)

1. A vertical cavity surface emitting laser, comprising:

an InP substrate,

a lower minor stack comprised of a plurality of alternating layers of AlPSb and GaPSb over thc InP substrate:

an active region over the lower mirror stack;

a top mirror stack over the active region, the top mirror stack comprising:

a first GaAs buffer layer;

a second GaAs seed layer over the first GaAs buffer layer; and

a plurality of alternating layers of GaAs and Al(Ga)As over the second GaAs seed layer,

wherein the top mirror stack is grown by MOCVD.

2. A vertical cavity surface emitting laser according to claim 1 , wherein the alternating layers of AlPSb and GaPSb are grown by MOCVD.

3. A vertical cavity surface emitting laser according to claim 1 , further including a lower InP spacer over the lower mirror stack.

4. A vertical cavity surface emitting laser according to claim 3 , wherein the lower InP spacer is grown by MOCVD.

5. A vertical cavity surface emitting laser according to claim 1 , wherein the active region includes AlInGaAs or InGaAsP.

6. A vertical cavity surface emitting laser according to claim 5 , further including a tunnel junction over the active region.

7. A vertical cavity surface emitting laser according to claim 6 , wherein the tunnel junction includes an MOCVD-grown GaAs (1-x) Sb x layer.

8. A vertical cavity surface emitting laser according to claim 1 , wherein the first GaAs buffer layer is grown by MOCYD between 400° C. and 450° C.

9. A vertical cavity surface emitting laser according to claim 1 , wherein the second GaAs seed layer is grown by MOCVD at about 600° C.

10. A vertical cavity surface emitting laser according to claim 9 , further including an insulating structure on the second GaAs seed layer, wherein the insulating structure includes an opening.

11. A vertical cavity surface emitting laser according to claim 9 , wherein tho GaAs/Al(Ga)As top mirror stack is grown by lateral epitaxcial overgrowth from the second GaAs seed layer.

12. A vertical cavity surface emitting laser, comprising:

an InP substrate;

a lower mirror stack comprised of a plurality of alternating layers of AlGalnAs and AlInAs over the lnP substrate;

an active region over the lower mirror stack;

a ton mirror stack over the active region, the top mirror stack comprising;

a first GaAs buffer layer;

a second GaAs secd layer over the first GaAs buffer layer; and

a plurality of alternating layers of GaAs and AI(Ga)As over the second GaAs seed layer,

wherein the top mirror stack is grown by MOCVD.

13. A vertical cavity surface emitting laser according to claim 12 , further including a lower InP spacer over the lower mirror stack.

14. A vertical cavity surface emitting laser according to claim 13 , wherein the lower InP spacer is grown by MOCVD.

15. A vertical cavity surface emitting laser according to claim 12 , wherein the active region includes AlInGaAs or InGaAsP.

16. A vertical cavity surface emitting laser according to claim 15 , further including a tunnel junction over the active region.

17. A vertical cavity surface emitting laser according to claim 16 , wherein the tunnel junction includes a MOCVD-grown GaAs (1-x) Sb x layer.

18. vertical cavity surface emitting laser according to claim 12 , wherein the first GaAs buffer layer is grown by MOCVD between 400° C. and 450° C., and wherein the second GaAs seed layer is grown by MOCVD at about 600° C.

19. A vertical cavity surface emitting laser according to claim 18 , further including an insulating structure on the second GaAs seed layer, wherein the insulating structure includes an opening.

20. A vertical cavity surface emitting laser according to claim 18 , wherein the GaAs/Al(Ga)As top mirror stack is grown by lateral epitaxial overgrowth from the second GaAs iced layer.

21. A vertical cavity surface emitting laser according to claim 1 wherein the first GaAs buffer layer is grown by MOCVD over 400° C.

22. A vertical cavity surface emitting laser according to claim 12 wherein the first GaAs buffer layer is grown by MOCVD over 400° C. and thc second GaAs seed layer is grown by MOCVD at about 600° C.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: FINISAR CORPORATION
To: II-VI DELAWARE, INC.
Reel/Frame 052286/0001 →