IP Library Granted Patent US 7,113,630
Granted Patent B2
US 7,113,630 · App. 10/079,780 · Granted Sep 26, 2006

PICA system detector calibration

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Quick Facts
Patent No.
US 7,113,630
App. No.
10/079,780
Granted
Sep 26, 2006
Kind
B2
Abstract

Methods, apparatus and data structures useful in correcting PICA image data are described. An exemplary method comprises acquiring optical image data of a target having identifiable optical-image features, acquiring PICA image data of the target having identifiable PICA-image features corresponding to the optical-image features, matching PICA-image features with corresponding optical-image features, and calculating from matched PICA-image features and optical-image features a set of coefficients defining relationships between observed positions of PICA-image features and optical-image features. Corrections are applied to the observed positions of detected photons based on the coefficients. The coefficients may provide a local correction using a bilinear relationship giving the transformation of a rectangle formed by four features of the PICA-image data to fit a corresponding rectangle in the optical-image data. Alternatively, the coefficients may provide a global mapping function defining transformation of any point of the PICA-image data to fit a corresponding point in the optical-image data.

Claims (15)

1. A method of correcting PICA image data, comprising:

a. Acquiring optical image data of a target having identifiable optical-image features,

b. Acquiring PICA image data of the target having identifiable PICA-image features corresponding to the optical-image features,

c. Preparing optical-image-background data by applying gray-scale erosion to the optical-image data,

d. Subtracting optical-image-background data from the optical-image data to produce flattened-optical-image data have lesser intensity gradients than the optical-image data,

e. matching PICA-image features with corresponding features of the flattened-optical-image data, and

f. Calculating from matched PICA-image features and optical-image features a set of coefficients defining relationships between observed positions of PICA-image features and optical-image features.

2. An apparatus for preparing corrected PICA image data, comprising:

a. An optical microscope for acquiring optical image data of a target having identifiable optical-image features,

b. A PICA camera for acquiring PICA image data of the target having identifiable PICA-image features corresponding to the optical-image features, and

c. Data processing equipment having instructions for matching PICA-image features with corresponding optical-image features by,

Preparing optical-image-background data by applying gray-scale erosion to the optical-image data,

Subtracting optical-image-background data from the optical-image data to produce flattened-optical-image data having lesser intensity gradients than the optical-image data, and

Matching PICA-image features with corresponding features of the flattened-optical-image data,

and calculating from matched PICA-image features and optical-image features a set of coefficients defining relationships between observed positions of PICA-image features and optical-image features.