IP Library Granted Patent US 7,026,228
Granted Patent B1
US 7,026,228 · App. 10/088,026 · Granted Apr 11, 2006

Methods of fabricating devices and semiconductor layers comprising cadmium mercury telluride, mercury telluride, and cadmium telluride

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Quick Facts
Patent No.
US 7,026,228
App. No.
10/088,026
Granted
Apr 11, 2006
Kind
B1
Abstract

The invention relates to a method of depositing Hg 1-x Cd x Te onto a substrate, in a MOVPE technique, where 0≦x≦1; comprising the step of reacting together a volatile organotellurium compound, and one or both of (i) a volatile organocadmium compound and (ii) mercury vapour; characterised in that the organotellurium compound is isopropylallyltelluride. The invention also relates to devices, such as infrared sensors and solar cells, that comprise Hg 1-x Cd x Te materials.

Claims (11)

1. A method of depositing Hg 1-x Cd x Te, where 0<x<1, onto a substrate, in a MOVPE technique, comprising reacting together isopropylallyltelluride, a volatile organocadmium compound and mercury vapor, wherein H 1-x Cd x Te is grown by an interdiffused multilayer process involving the alternate growth of cadmium telluride and mercury telluride layers, which are then interdiffused to produce Hg 1-x Cd x Te, and wherein the substrate is maintained at a temperature in the range 150° C. to 350° C.

2. A method of depositing Hg 1-x Cd x Te according to claim 1 wherein the organocadmium compound is an alkyl cadmium compound.

3. A method of depositing Hg 1-x Cd x Te according to claim 2 wherein the alkyl cadmium compound is dimethyl cadmium.

4. A method of depositing Hg 1-x Cd x Te according to claim 1 wherein the substrate comprises glass, or glass coated with indium tin oxide, or CdTe, or CdZnTe, or GaAs, or GaAs/Si, or CdTe/GaAs, or Si.

5. A method of depositing Hg 1-x Cd x Te according to claim 1 wherein the temperature of the substrate is maintained at a temperature in the range 150° C. to 300° C.

6. A method of depositing Hg 1-x Cd x Te according to claim 5 wherein the temperature of the substrate is maintained at a temperature in the range 250° C. to 300° C.

7. A method of fabricating an electronic device comprising the steps of (a) depositing Hg 1-x Cd x Te onto a substrate by a method according to claim 1 ; and (b) connecting at least two electrodes to the Hg 1-x Cd x Te.

8. A method of fabricating an electronic device according to claim 7 wherein the method further comprises the step of doping the Hg 1-x Cd x Te.

9. A method of fabricating an electronic device according to claim 7 wherein the method comprises the further step of doping the Hg 1-x Cd x Te material in such a manner that a p-n junction is formed.

10. A method of fabricating a device according to claim 7 wherein the method further comprises the step of growing a passivating layer of CdTe on the Hg 1-x Cd x Te.

11. A method of depositing Hg 1-x Cd x Te according to claim 1 , wherein the cadmium telluride layer is deposited in the presence of mercury vapor.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2015
From: QINETIQ LIMITED
To: FLIR SYSTEMS TRADING BELGIUM
Reel/Frame 036639/0473 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2002
From: HAILS, JANET E.; TURNEY, SAAMARA N. (LEGAL REPRESENTATIVE) JOHN STEVENSON (DECEASED); COLE-HAMILTON, DAVID J.; BELL, WILLIAM; FOSTER,DOUGLAS F.
To: QINETIQ LIMITED
Reel/Frame 015125/0946 →