Water reclamation rate in semiconductor fabrication wet benches
View Patent ↗Embodiments of the present invention are directed to improving the reclamation rate of the waste water of wet benches in semiconductor fabrication. In accordance with an aspect of the invention, a method for improvement of water reclamation rate comprises choosing a rinse recipe for a wet bench. The wet bench is activated, and waste water quality of waste water produced by the rinse recipe from the wet bench is detected to generate water quality data for a plurality of reclamation switch time levels. The waste water is directed to a water reclamation system during a reclamation time period after each of the plurality of reclamation switch time levels. The water quality data of the waste water is analyzed for the plurality of reclamation switch time levels. The method further comprises determining from analyzing the water quality data the best reclamation switch time for the chosen rinse recipe for the wet bench.
1. A method for improvement of water reclamation rate in a semiconductor fabrication wet bench, the method comprising:
choosing a rinse recipe specifying a type of rinse for a wet bench used to remove chemical residue on one or more wafer surfaces;
activating the wet bench and detecting waste water quality of waste water produced by the rinse recipe from the wet bench to generate water quality data for a plurality of reclamation switch time levels, the waste water being directed to a water reclamation system during a reclamation time period after each of the plurality of reclamation switch time levels;
analyzing the water quality data of the waste water for the plurality of reclamation switch time levels; and
determining from analyzing the water quality data the best reclamation switch time for the chosen rinse recipe for the wet bench, wherein the waste water is to be discarded before reaching the reclamation switch time and to be reclaimed after reaching the reclamation switch time.
2. The method of claim 1 wherein the water quality data is collected by a data recorder.
3. The method of claim 1 wherein the rinse recipe comprises a quick-dump rinse recipe.
4. The method of claim 1 wherein the rinse recipe comprises an overflow rinse recipe.
5. The method of claim 1 wherein the rinse recipe comprises a final-rinse recipe.
6. The method of claim 1 wherein a parameter of the waste water quality to be detected comprises conductivity of the waste water.
7. The method of claim 1 wherein the water quality data is analyzed by a computer to produce a plurality of water quality curves of the waste water, each water quality curve corresponding to one of the reclamation switch time levels.
8. The method of claim 7 wherein a parameter of the waste water quality to be detected comprises conductivity of the waste water.
9. The method of claim 8 wherein the best reclamation switch time is determined by selecting the lowest reclamation switch time level at which the conductivity of the waste water directed to the water reclamation system is generally below a preset limit.
10. The method of claim 9 wherein the preset limit is about 1000 μs/cm.
11. The method of claim 9 wherein the best reclamation switch time is determined by selecting the lowest reclamation switch time level at which the conductivity of the waste water is below the preset limit over at least about 90% of the reclamation time period.
12. The method of claim 11 wherein the conductivity of the waste water is below the preset limit over at least about 95% of the reclamation time period.
13. A method for improvement of water reclamation rate in semiconductor fabrication wet benches, the method comprising:
choosing a rinse recipe specifying a type of rinse and setting a reclamation switch time for a wet bench used to remove chemical residue on one or more wafer surfaces;
activating the wet bench and detecting waste water quality of waste water produced by the rinse recipe from the wet bench to generate water quality data;
resetting the reclamation switch time for the wet bench and repeating the step of activating the wet bench and detecting the waste water quality of the waste water to generate corresponding water quality data for each of a plurality of reclamation switch time levels; and
analyzing the water quality data for the plurality of reclamation switch time levels to obtain the best reclamation switch time,
wherein the waste water is to be discarded before reaching the reclamation switch time and to be reclaimed after reaching the reclamation switch time.
14. The method of claim 13 wherein the water quality data is analyzed by a computer to produce a plurality of water quality curves of the waste water, each water quality curve corresponding to one of the reclamation switch time levels.
15. The method of claim 14 wherein a parameter of the waste water quality to be detected comprises conductivity of the waste water.
16. The method of claim 15 wherein the waste water is directed to a water reclamation system during a reclamation period after each of the plurality of reclamation switch time levels, and wherein the best reclamation switch time is determined by selecting the lowest reclamation switch time level at which the conductivity of the waste water directed to the water reclamation system is generally below a preset limit.
17. The method of claim 16 wherein the preset limit is about 1000 μs/cm.
18. The method of claim 16 wherein the best reclamation switch time is determined by selecting the lowest reclamation switch time level at which the conductivity of the waste water is below the preset limit over at least about 90% of the reclamation time period.
19. The method of claim 18 wherein the conductivity of the waste water is below the preset limit over at least about 95% of the reclamation time period.
20. The method of claim 13 wherein the rinse recipe is selected from the group consisting of a quick-dump rinse recipe, an overflow rinse recipe, and a final-rinse recipe.