Bench based integrated wavelength locker
View Patent ↗A wavelength monitor includes: a splitter on an optics block dividing an input beam into a first portion and a second portion; a first detector and a second detector; a wavelength selective element in an optical path of one of the first and second portions before a respective detector; and an optical bench on which the splitter, the first and second detectors, and the wavelength selective element are mounted. The optical bench may include a hole through which an application beam, separate from the first and second portions, is to pass. The optical bench may include a reflective surface below an active area of the detectors for directing the light onto the active areas.
1. A wavelength monitor comprising:
a splitter on an optics block dividing an input beam into a first portion and a second portion;
a first detector and a second detector;
a wavelength selective element in an optical path of one of the first and second portions before a respective detector; and
an optical bench on which the splitter, the first and second detectors, and the wavelength selective element are mounted, the optical bench including a hole between the first and second detectors through which an application beam, separate from the first and second portions, is to pass.
2. The wavelength monitor of claim 1 , wherein the optical bench is a silicon bench.
3. The wavelength monitor of claim 1 , wherein the hole is metalized.
4. The wavelength monitor of claim 1 , wherein the hole is an etched groove.
5. The wavelength monitor of claim 1 , further comprising bonding pads for the first and second detectors on the optical bench.
6. The wavelength monitor of claim 1 , wherein the first and second detectors are flip-chip bonded to the optical bench.
7. The wavelength monitor of claim 1 , further comprising a reflective surface directing the first and second portions to their respective detectors.
8. The wavelength monitor of claim 7 , wherein the reflective surface is formed on a surface of the optical bench.
9. The wavelength monitor of claim 8 , wherein the reflective surface includes a reflective coating on an etched surface of the optical bench.
10. The wavelength monitor of claim 7 , wherein the reflective surface is below a respective detector and directs light up onto the detector.
11. The wavelength monitor of claim 1 , wherein the detectors are edge detectors.
12. The wavelength monitor of claim 1 , further comprising a mounting platform on the optical bench for the detectors which rise above a mounting level on the optical bench for the optics block.
13. The wavelength monitor of claim 12 , wherein the wavelength selective filter is on the mounting level with the optics block.
14. The wavelength monitor of claim 12 , wherein the mounting platform extends at a same height along the optical bench.
15. The wavelength monitor of claim 14 , wherein the hole is in the mounting platform.
16. The wavelength monitor of claim 14 , wherein the hole is an etched groove in the mounting platform.
17. The wavelength monitor of claim 12 , further comprising a reflective surface in the mounting platform below the detectors.
18. The wavelength monitor of claim 1 , wherein active regions of the first and second detectors extend above the mounting platform to effectively detect the respective first and second portions.
19. The wavelength monitor of claim 1 , wherein the optical bench further comprises a mounting area for a light source to be monitored.
20. The wavelength monitor of claim 19 , wherein the mounting area is at a same height as a mounting level of the optical bench for the optics block.
21. The wavelength monitor of claim 1 , wherein the optics block further comprises an optical element on a surface thereof for at least one of the first portion, the second portion and the application beam.
22. The wavelength monitor of claim 21 , wherein the optical element provides at least one of focusing and collimating.
23. An optical bench comprising:
a mounting platform having an upper surface and an indent, wherein the upper surface is to receive a photodetector and a photosensitive portion of the photodetector is to face the indent, the mounting platform including a hole, adjacent to the indent, through which light to be output from the optical bench passes; and
a reflective surface below the upper surface, the reflective surface directing light incident hteroen to the photosensitive portion of the photodetector.
24. The optical bench of claim 23 , wherein the reflective surface is in the indent.
25. The optical bench of claim 23 , wherein the reflective surface is in a surface of the indent.
26. The optical bench of claim 23 , wherein the indent is a V-groove.
27. The optical bench of claim 23 , wherein the reflective surface has a reflective coating.
28. The optical bench of claim 23 , further comprising a mount for a light source.
29. The optical bench of claim 28 , further comprising a mount for optical elements directing light between the light source and the photodetector.
30. The optical bench of claim 23 , further comprising optical elements that direct only part of input light to the photodetector.
31. A wavelength monitor comprising:
a beam on an optics block dividing an input beam into a first portion and a second portion;
a first edge detector and a second edge detector;
a wavelength selective element in an optical path of one of the first and second portions before a respective detector; and
an optical bench on which the splitter, the first and second detectors, and the wavelength selective element are mounted, the optical bench including a hole through which an application beam, separate from the first and second portions, is to pass.