IP Library › Granted Patent US 6,674,281
Granted Patent Utility Small
US 6,674,281 · Confirmation No. 7459

METHOD FOR MEASURING MAGNETIC FIELD BASED ON ELECTRO-OPTIC PROBING TECHNIQUE AND MEASURING ELECTRIC FIELD BASED ON MAGNETIC PROBING TECHNIQUE

Inventor: Kuen-Wey Shieh
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 Code Description Pages PDF
2003-11-10 IFEE Issue Fee Payment (PTO-85B) 3 View
2002-03-18 TRNA Transmittal of New Application 2 View
2002-03-18 ADS Application Data Sheet 2 View
2002-03-18 SPEC Specification 10 View
2002-03-18 CLM Claims 3 View
2002-03-18 ABST Abstract 1 View
2002-03-18 DRW Drawings-only black and white line drawings 3 View
2002-03-18 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,674,281
App. No.
10/100,382
Filed
2002-03-18
Granted
2004-01-06
Pub. No.
US20030173960A1
Art Unit
2862
PTA
0 days