IP Library Granted Patent US 6,951,800
Granted Patent B2
US 6,951,800 · App. 10/101,174 · Granted Oct 4, 2005

Method of making semiconductor device that has improved structural strength

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Quick Facts
Patent No.
US 6,951,800
App. No.
10/101,174
Granted
Oct 4, 2005
Kind
B2
Abstract

A method of making a semiconductor device includes a back-grinding step of grinding a back surface of a semiconductor substrate, a dicing step of dicing the semiconductor substrate along predetermined dicing lines so as to make pieces of semiconductor devices after the back-grinding step, and a laser exposure step of shining laser light on the back surface of the semiconductor substrate after the back-grinding step so as to remove grinding marks generated by the back-grinding step.

Claims (4)

1. A method of making a semiconductor device, comprising;

a back-grinding step of grinding a back surface of a semiconductor substrate;

a grinding-mark generating step of generating grinding marks that extend in a direction different from directions of the predetermined dicing lines after said back-grinding step, said grinding marks being generated by grinding the back surface of the semiconductor substrate by a grinding apparatus that includes a plurality of end-mills; and

a dicing step of dicing the semiconductor substrate along the predetermined dicing lines so as to create pieces of semiconductor devices after said grinding-mark generating step.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0923 →