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App. No. 10/105,507 · Confirmation No. 2483

METHOD FOR DETECTING METAL CONTAMINATION ON A SILICON CHIP BY IMPLANTING ARSENIC

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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2002-03-26 SRFW Search information including classification, databases and other search related notes 1 View
2002-03-26 FWCLM Index of Claims 1 View
2002-03-26 TRNA Transmittal of New Application 2 View
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Quick Facts
App. No.
10/105,507
Filed
2002-03-26
Granted
2004-04-27
Pub. No.
US20020137343A1
Art Unit
1765
PTA
-4 days