Patent Application
Utility
App. No. 10/106,537
· Confirmation No. 9537
TESTING SYSTEM AND TESTING METHOD FOR STRUCTURE
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2002-03-27 | TRNA |
Transmittal of New Application | 3 | View | |
| 2002-03-27 | A.PE |
Preliminary Amendment | 5 | View | |
| 2002-03-27 | SPEC |
Specification | 25 | View | |
| 2002-03-27 | CLM |
Claims | 8 | View | |
| 2002-03-27 | ABST |
Abstract | 1 | View | |
| 2002-03-27 | DRW |
Drawings-only black and white line drawings | 9 | View | |
| 2002-03-27 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Wataru Yamagishi
Abiko-shi, JAPAN
Toshihiko Horiuchi
Ushiku-shi, JAPAN
Masahiko Inoue
Ibaraki-ken, JAPAN
Kazuhiro Umekita
Tsuchiura-shi, JAPAN
Yasuyuki Momoi
Ushiku-shi, JAPAN
Attorneys & Agents of Record
Classification
USPC
702/42
G01M7/022
G01V1/01
G01M7/06
Prosecution
- Examiner
- VO, HIEN XUAN
- Art Unit
- 2863
- Docket No.
- 381HI/47956DV
- Confirmation No.
- 9537
Foreign Priority
10-178383
·
1998-06-25
·
JAPAN
Publication
- Pub. No.
- US20020116136A1
- Pub. Date
- 2002-08-22
Patent Term Adjustment
-2days
from
HITACHI LTD.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2007-03-05
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Quick Facts
- App. No.
- 10/106,537
- Filed
- 2002-03-27
- Granted
- 2003-09-30
- Pub. No.
- US20020116136A1
- Examiner
- VO, HIEN XUAN
- Art Unit
- 2863
- PTA
- -2 days
External Links