IP Library Granted Patent US 7,019,910
Granted Patent B2
US 7,019,910 · App. 10/115,001 · Granted Mar 28, 2006

Inspection microscope and objective for an inspection microscope

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Quick Facts
Patent No.
US 7,019,910
App. No.
10/115,001
Granted
Mar 28, 2006
Kind
B2
Abstract

An inspection microscope ( 1 ) having a light source ( 3 ) that emits light of a first wavelength below 400 nm for illumination of a specimen ( 13 ) to be inspected, and having an objective ( 11 ) that is composed of multiple optical components and has a numerical aperture and a focal length, and having a tube optical system ( 21 ) and an autofocus device ( 25 ) that directs light of a second wavelength onto the specimen ( 13 ), is disclosed. The inspection microscope ( 1 ) is characterized by the objective ( 11 ), which has an optical correction that eliminates the longitudinal chromatic aberrations with respect to the first and the second wavelength and whose optical components are assembled in cement-free fashion, the second wavelength being greater than 400 nm.

Claims (28)

1. An inspection microscope comprising:

a light source, emitting light of a first wavelength below 400 nm for illumination of a specimen to be inspected,

an objective comprising multiple optical components, wherein the objective has a numerical aperture greater than 0.55 and a focal length less than 3.5 mm,

a tube optical system,

an autofocus device that directs light of a second wavelength onto the specimen, wherein the second wavelength is greater than 400 nm, wherein the objective shows an optical correction that eliminates longitudinal chromatic aberrations with respect to the first and the second wavelengths, and

a cement-free and contactless mounting of all optical components of the objective such that a gap is provided between adjacent optical components.

2. The inspection microscope as defined in claim 1 , wherein the optical components are lens elements.

3. The inspection microscope as defined in claim 2 , wherein at least one lens element of the objective is fabricated from calcium fluoride or quartz glass or barium fluoride or lithium fluoride or strontium fluoride.

4. The inspection microscope as defined in claim 1 , wherein an air gap is provided between at least two optical components.

5. The inspection microscope as defined in claim 1 , wherein aberrations are corrected by the coaction of the objective and tube optical system.

6. The inspection microscope as defined in claim 1 , wherein the tube optical system contains lens elements assembled in cement-free fashion.

7. The inspection microscope as defined in claim 1 , wherein the tube optical system is configured in such a way that as a result of the coaction of the tube optical system and objective, the longitudinal chromatic error of the objective is compensated for in a region less than 10 nm above and below the first wavelength.

8. The inspection microscope as defined in claim 1 , wherein the tube optical system is configured in such a way that as a result of the coaction of the tube optical system and the objective, the transverse chromatic error of the tube optical system is compensated for in a region less than 10 nm above and below the first wavelength.

9. The inspection microscope as defined in claim 1 , wherein the first wavelength lies in a region from 243 nm to 266 nm.

10. The inspection microscope as defined in claim 9 , wherein the first wavelength is 248 nm.

11. The inspection microscope as defined in claim 1 , wherein the second wavelength is greater than 800 nm.

12. The inspection microscope as defined in claim 11 , wherein the second wavelength is 903 nm.

13. The inspection microscope as defined in claim 1 , wherein the tube optical system does not contain cemented lens elements.

14. An objective that transmits light of a first wavelength below 400 nm and light of a second wavelength above 400 nm comprises:

multiple optical components , wherein the objective has a numerical aperture as well as a magnification, wherein the numerical aperture is greater than 0.55 and the focal length is less than 3.5 mm,

an optical correction that eliminates longitudinal chromatic aberrations with respect to the first and the second wavelengths, and

a cement-free and contactless mounting of all optical components such that a gap is provided between adjacent optical components.

15. The objective as defined in claim 14 , wherein the optical components are lens elements.

16. The objective as defined in claim 15 , wherein at least one lens element of the objective is fabricated from calcium fluoride or quartz glass or barium fluoride or lithium fluoride or strontium fluoride.

17. The objective as defined in claim 14 , wherein the first wavelength lies in the region from 243 nm to 266 nm.

18. The objective as defined in claim 18 , wherein the first wavelength is 248 nm.

19. The objective as defined in claim 14 , wherein the second wavelength is greater than 800 nm.

20. The objective as defined in claim 19 , wherein the second wavelength is 903 nm.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2005
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 016536/0330 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 4, 2002
From: HOPPEN, GERHARD
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 012763/0588 →