Patent Application
Utility
App. No. 10/143,880
· Confirmation No. 3906
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND FAULT-DETECTING METHOD OF A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Inventor:
Ichiro Kohno
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-09-15 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-06-15 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-15 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-15 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-06-15 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 2 | View | |
| 2004-06-15 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-06-01 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-04-28 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-04-28 | CLM |
Claims | 2 | View | |
| 2004-04-28 | REM |
Applicant Arguments/Remarks Made in an Amendment | 2 | View | |
| 2004-04-28 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2004-04-28 | M852 |
Letter to Official Draftsman Filed P/E | 3 | View | |
| 2004-04-28 | XT/ |
Extension of Time | 1 | View | |
| 2003-10-28 | CTNF |
Non-Final Rejection | 5 | View | |
| 2003-10-28 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-10-28 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2003-09-25 | ELC. |
Response to Election / Restriction Filed | 1 | View | |
| 2003-09-25 | CLM |
Claims | 4 | View | |
| 2003-09-25 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2003-09-25 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2003-08-26 | CTRS |
Requirement for Restriction/Election | 4 | View | |
| 2002-05-14 | TRNA |
Transmittal of New Application | 1 | View | |
| 2002-05-14 | SPEC |
Specification | 24 | View | |
| 2002-05-14 | CLM |
Claims | 5 | View | |
| 2002-05-14 | ABST |
Abstract | 1 | View | |
| 2002-05-14 | DRW |
Drawings-only black and white line drawings | 19 | View | |
| 2002-05-14 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-05-14 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2002-05-14 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2002-05-14 | FWCLM |
Index of Claims | 1 | View | |
| 2002-05-14 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-05-14 | DRW |
Drawings-only black and white line drawings | 19 | View | |
| 2002-05-14 | SPEC |
Specification | 23 | View | |
| 2002-05-14 | CLM |
Claims | 5 | View | |
| 2002-05-14 | ABST |
Abstract | 1 | View | |
| 2002-05-14 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-05-14 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-05-14 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-05-14 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2002-05-14 | FRPR |
Certified Copy of Foreign Priority Application | 48 | View | |
| 2002-05-14 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View |
Inventors
Ichiro Kohno
Kokubunji, JAPAN
Attorneys & Agents of Record
Classification
USPC
326/38
G01R31/318536
G01R31/318541
Prosecution
- Examiner
- CHANG, DANIEL D
- Art Unit
- 2819
- Docket No.
- HITA.0194
- Confirmation No.
- 3906
Foreign Priority
2001-151983
·
2001-05-22
·
JAPAN
Publication
- Pub. No.
- US20020175699A1
- Pub. Date
- 2002-11-28
Patent Term Adjustment
-91days
No related applications found.
from
HITACHI, LTD.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2006-11-28
from
HITACHI, LTD.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-10-01
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Quick Facts
- App. No.
- 10/143,880
- Filed
- 2002-05-14
- Granted
- 2004-10-19
- Pub. No.
- US20020175699A1
- Examiner
- CHANG, DANIEL D
- Art Unit
- 2819
- PTA
- -91 days
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