IP Library Granted Patent US 6,836,134
Granted Patent Utility
US 6,836,134 · Confirmation No. 6645

APPARATUS AND METHOD FOR DETERMINING LEAKAGE CURRENT BETWEEN A FIRST SEMICONDUCTOR REGION AND A SECOND SEMICONDUCTOR REGION TO BE FORMED THEREIN

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2004-08-09 1449 List of References cited by applicant and considered by examiner 1 View
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2004-08-09 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-08-09 BIB Bibliographic Data Sheet 2 View
2004-08-09 FWCLM Index of Claims 1 View
2004-08-09 SRFW Search information including classification, databases and other search related notes 1 View
2004-07-19 SRNT Examiner's search strategy and results 4 View
2003-11-28 IDS Information Disclosure Statement (IDS) Form (SB08) 4 View
2003-11-13 ELC. Response to Election / Restriction Filed 1 View
2003-10-15 CTRS Requirement for Restriction/Election 4 View
2003-10-15 FWCLM Index of Claims 1 View
2003-10-15 SRFW Search information including classification, databases and other search related notes 1 View
2002-08-27 LET. Miscellaneous Incoming Letter 2 View
2002-06-11 TRNA Transmittal of New Application 3 View
2002-06-11 SPEC Specification 13 View
2002-06-11 CLM Claims 5 View
2002-06-11 ABST Abstract 1 View
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2002-06-11 OATH Oath or Declaration filed 2 View
2002-06-11 LET. Miscellaneous Incoming Letter 1 View
2002-06-11 TRNA Transmittal of New Application 3 View
2002-06-11 DRW Drawings-only black and white line drawings 6 View
2002-06-11 SPEC Specification 13 View
2002-06-11 CLM Claims 5 View
2002-06-11 ABST Abstract 1 View
2002-06-11 OATH Oath or Declaration filed 2 View
2002-06-11 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
Patent No.
US 6,836,134
App. No.
10/167,125
Filed
2002-06-11
Granted
2004-12-28
Pub. No.
US20030227293A1
Art Unit
2829
PTA
-15 days