Semiconductor laser element
View Patent ↗There is provided a semiconductor laser element, which has a small capacitance outside a ridge portion and high response speed and is able to effect pulse oscillation with a satisfactory pulse waveform. On a GaAs substrate 101 , there are provided an n-type buffer layer 102 , an n-type first clad layer 103 , an MQW active layer 104 , a p-type second clad layer 105 , a p-type etching stop layer 106 that has an energy bandgap smaller than that of this second clad layer 105 , a p-type third clad layer 107 that constitutes a ridge portion and a p-type protective layer 108 . On both sides in the widthwise direction of the ridge portion are laminated a p-type spacer layer 109 , an n-type current light confining layer 110 , an n-type current confining layer 111 and a p-type flattening layer 112 . On these layers is laminated a p-type contact layer 113 . A depletion layer spreads into the spacer layer 109 when a bias voltage is applied. Therefore, a capacitance between the spacer layer 109 and the current light confining layer 110 is reduced, and a response speed during the pulse oscillation of the semiconductor laser element becomes fast.
1. A semiconductor laser element, comprising:
a first conductive type first clad layer,
an active layer,
a second conductive type second clad layer,
a second conductive type etching stop layer that has an energy bandgap smaller than that of the second clad layer,
a ridge-shaped second conductive type third clad layer,
a first conductive type current light confirming layer that is arranged on both sides in a widthwise direction of the third clad layer and has a reflective index smaller then a refractive index of the second clad layer; and
a second conductive type or intrinsic spacer layer arranged in contact with the etching stop layer between the etching stop layer and the current light confining layer.
2. A semiconductor laser element as claimed in claim 1 , wherein
the spacer layer has a refractive index equal to or smaller than the reflective index of the second clad layer.
3. A semiconductor laser element as claimed in claim 1 , wherein
the spacer layer has a carrier density lower than a carrier density of the second clad layer.
4. A semiconductor laser element as claimed in claim 3 , wherein
the carrier density of the spacer layer is not higher than 1×10 18 cm −3 .
5. A semiconductor laser element as claimed in claim 1 , wherein an interfacial portion of the current light confining layer, which is in contact with the spacer layer, has a carrier density lower than the remainder of the current light confining layer.
6. A semiconductor laser element as claimed in claim 5 , wherein the carrier density of the interfacial portion of the current light confining layer in contact with the spacer layer is not higher than 1×10 18 cm −3 .
7. A semiconductor laser element as claimed in claim 1 , wherein
the spacer layer has a thickness of not smaller than 0.05 μm and not greater than 0.5 μm.
8. A semiconductor laser element as claimed in claim 7 , wherein
the spacer layer has a thickness of not smaller than 0.1 μm and not greater than 0.3 μm.
9. A semiconductor laser element as claimed in claim 5 , wherein the interfacial portion of the current light confining layer in contact with the spacer layer has a thickness of not smaller than 0.5 μm and not greater than 0.5 μm.
10. A semiconductor laser element as claimed in claim 1 , wherein the spacer layer is doped with an impurity than contains carbon.
11. A semiconductor laser element as claimed in claim 1 , wherein the etching stop layer in contact with the spacer layer is doped with an impurity that contains carbon.
12. A semiconductor laser element as claimed in claim 1 , wherein the second clad layer is doped with an impurity that contains carbon at least on the spacer layer side.
13. A semiconductor laser element as claimed in claim 12 , wherein the second clad layer is doped with an impurity other than carbon in its portion that is in contact with the active layer.
14. A semiconductor laser element as claimed in claim 1 , wherein the second clad layer has a portion in contact with the active layer that has a carrier density higher than a carrier density of its portion in contact with the spacer layer.
15. A semiconductor laser element as claimed in claim 1 , wherein the current light confining layer is doped with an impurity that contains silicon.