Patent Application
Utility
App. No. 10/175,863
· Confirmation No. 3274
SEMICONDUCTOR APPARATUS AND METHOD FOR FABRICATING THE SAME
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2005-05-10 | CTMS |
Miscellaneous Action with shortened statutory period (SSP) | 4 | View | |
| 2004-09-21 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2004-09-21 | FOR |
Foreign Reference | 21 | View | |
| 2004-09-21 | FOR |
Foreign Reference | 17 | View | |
| 2004-09-21 | FOR |
Foreign Reference | 20 | View | |
| 2004-09-21 | FOR |
Foreign Reference | 41 | View | |
| 2004-08-23 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-08-23 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2003-11-26 | IFEE |
Issue Fee Payment (PTO-85B) | 2 | View | |
| 2003-11-13 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2003-11-13 | FOR |
Foreign Reference | 10 | View | |
| 2003-11-13 | FOR |
Foreign Reference | 23 | View | |
| 2003-11-13 | FOR |
Foreign Reference | 12 | View | |
| 2003-08-28 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 4 | View | |
| 2003-08-28 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2003-08-28 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-08-28 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2003-08-28 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-08-18 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-07-26 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2003-06-26 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-06-26 | CLM |
Claims | 2 | View | |
| 2003-06-26 | REM |
Applicant Arguments/Remarks Made in an Amendment | 7 | View | |
| 2003-06-26 | XT/ |
Extension of Time | 2 | View | |
| 2003-01-08 | CTNF |
Non-Final Rejection | 11 | View | |
| 2003-01-08 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-01-08 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2002-12-20 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2002-12-19 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2002-06-21 | TRNA |
Transmittal of New Application | 4 | View | |
| 2002-06-21 | TRNA |
Transmittal of New Application | 5 | View | |
| 2002-06-21 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2002-06-21 | A.PE |
Preliminary Amendment | 4 | View | |
| 2002-06-21 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2002-06-21 | SPEC |
Specification | 30 | View | |
| 2002-06-21 | FWCLM |
Index of Claims | 1 | View | |
| 2002-06-21 | CLM |
Claims | 10 | View | |
| 2002-06-21 | ABST |
Abstract | 1 | View | |
| 2002-06-21 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2002-06-21 | DRW |
Drawings-only black and white line drawings | 14 | View | |
| 2002-06-21 | SPEC |
Specification | 30 | View | |
| 2002-06-21 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-06-21 | CLM |
Claims | 10 | View | |
| 2002-06-21 | ABST |
Abstract | 1 | View | |
| 2002-06-21 | OATH |
Oath or Declaration filed | 3 | View | |
| 2002-06-21 | DRW |
Drawings-only black and white line drawings | 14 | View | |
| 2002-06-21 | A.PE |
Preliminary Amendment | 1 | View | |
| 2002-06-21 | SPEC |
Specification | 1 | View | |
| 2002-06-21 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2002-06-21 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2002-06-21 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2002-06-21 | WFEE |
Fee Worksheet (SB06) | 1 | View |
Inventors
Shinzi Kawada
Miyagi, JAPAN
Hiroyuki Kawano
Miyagaki, JAPAN
Attorneys & Agents of Record
Classification
USPC
438/424
H10W10/0143
H10W10/17
Prosecution
- Examiner
- ZARNEKE, DAVID A
- Art Unit
- 2891
- Docket No.
- OKI.238D
- Confirmation No.
- 3274
Foreign Priority
2000-161928
·
2000-05-31
·
JAPAN
Publication
- Pub. No.
- US20020160615A1
- Pub. Date
- 2002-10-31
Patent Term Adjustment
-79days
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Quick Facts
- App. No.
- 10/175,863
- Filed
- 2002-06-21
- Granted
- 2004-10-19
- Pub. No.
- US20020160615A1
- Examiner
- ZARNEKE, DAVID A
- Art Unit
- 2891
- PTA
- -79 days
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