IP Library Granted Patent US 6,853,417
Granted Patent B2
US 6,853,417 · App. 10/178,523 · Granted Feb 8, 2005

Slant reflector with bump structure and fabricating method thereof

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Quick Facts
Patent No.
US 6,853,417
App. No.
10/178,523
Granted
Feb 8, 2005
Kind
B2
Abstract

A method of fabricating a slant reflector with a bump structure, includes the steps of: providing a substrate; forming a layer of photosensitive material on the substrate; patterning the photosensitive material to form a plurality of trapezoidal bumps that have different bottom areas and that are joined to each other at their bottoms; and smoothing the trapezoidal bumps to form a bump structure with an inclined angle. The invention utilizes a photo-mask with a particular pattern and optical diffraction to fabricate the bump structure in a simple way.

Claims (44)

1. A method of fabricating a slant reflector with a bump structure, comprising the steps of:

providing a substrate;

forming a layer of photosensitive material on the substrate;

patterning the photosensitive material to form a plurality of bumps which have bottoms with different bottom areas and which have heights that differ depending on the bottom area, such that the larger the bottom area of one of the bumps, the larger the height of said one of the bumps, the bumps being joined at the bottoms; and

smoothing the bumps to form the bump structure, the bump structure having an inclined angle.

2. The method of fabricating a slant reflector with a bump structure according to claim 1 , wherein the step of smoothing the bumps comprises the steps of:

melting the bumps by baking; and

reflowing the bumps to form the bump structure with the inclined angle.

3. The method of fabricating a slant reflector with a bump structure according to claim 1 , wherein the step of patterning comprises a single exposure step and a development step.

4. A method of fabricating a slant reflector with a bump structure, comprising the steps of:

providing a substrate;

forming a layer of photosensitive material on the substrate;

patterning the photosensitive material to form m groups of patterns (m≧1, m is positive integer), wherein each group includes a plurality of bumps which have bottoms with different bottom areas and which have heights that differ depending on the bottom area, such that the larger the bottom area of one of the bumps, the larger the height of said one of the bumps, the bumps being joined at the bottoms; and

smoothing the bumps to form the bump structure, the bump structure having an inclined angle.

5. The method of fabricating a slant reflector with a bump structure according to claim 4 , wherein the step of patterning the photosensitive material includes exposing and developing the photosensitive material.

6. The method of fabricating a slant reflector with a bump structure according to claim 5 , wherein a photo-mask is provided for exposing the photosensitive material.

7. The method of fabricating a slant reflector with a bump structure according to claim 6 , wherein the photo-mask has m groups of patterns (m≧1, m is positive integer), and each group of patterns includes a plurality of opaque bars which have different widths, and there is an opaque strip in a slit between adjacent opaque bars.

8. The method of fabricating a slant reflector with a bump structure according to claim 5 , wherein the step of exposing the photosensitive material is conducted in a single exposure step.

9. The method of fabricating a slant reflector with a bump structure according to claim 4 , wherein the joined bumps in each group are arranged in an orderly manner, from the bump with the largest bottom area to the bump with the smallest bottom area.

10. The method of fabricating a slant reflector with a bump structure according to claim 4 , wherein the m groups of patterns formed of the photosensitive material are arranged in a predetermined order.

11. The method of fabricating a slant reflector with a bump structure according to claim 4 , wherein the m groups of patterns formed of the photosensitive material are randomly arranged.

12. The method of fabricating a slant reflector with a bump structure according to claim 4 , wherein each group of patterns includes n bumps (n≧2, n is positive integer).

13. The method of fabricating a slant reflector with a bump structure according to claim 12 , wherein m groups of bump structures with the inclined angle are formed after smoothing, and each group includes n bumps (n≧2, n is positive integer).

14. A method of fabricating a slant reflector with a bump structure, comprising the steps of:

providing a substrate;

forming a layer of photosensitive material on the substrate;

patterning the photosensitive material to form a plurality of bumps which have bottoms with different bottom areas and which have heights that differ depending on the bottom area, such that the larger the bottom area of one of the bumps, the larger the height of said one of the bumps, the bumps being joined at the bottoms;

smoothing the bumps to form the bump structure, the bump structure having an inclined angle; and

forming a reflective metal film on the substrate to cover the bump structure with the inclined angle.

15. The method of fabricating a slant reflector with a bump structure according to claim 14 , wherein the step of patterning the photosensitive material includes exposing and developing the photosensitive material.

16. The method of fabricating a slant reflector with a bump structure according to claim 14 , wherein the step of smoothing the bumps comprises the steps of:

melting the bumps by baking; and

reflowing the bumps to form the bump structure with the inclined angle.

17. The method of fabricating a slant reflector with a bump structure according to claim 14 , wherein the slant reflector with a bump structure is incorporated in a reflective liquid crystal display (LCD).

18. A method of fabricating a slant reflector with a bump structure, comprising the steps of:

forming a layer of photosensitive material on a substrate;

exposing the photosensitive material through a photo-mask having a first region that is substantially transparent except for a multi-slits structure and having a second region that is opaque; and

developing the photosensitive material, so that a first part of the photosensitivity material layer forms a concave portion, the first part of the photosensitive material being associated with the first region of the photo-mask; and

smoothing the photosensitive material to form a contiguous deformity structure with a predetermined inclined angle.

19. A method of fabricating a slant reflector with a bump structure, comprising the steps of:

forming a layer of photosensitive material on a substrate, the layer of photosensitive material having a first part and a second part;

exposing the photosensitive material through a photo-mask having a first region that is substantially transparent except for a multi-slits structure and having a second region that is opaque, the first region of the photo-mask being associated with the first part of the layer of photosensitive material and the second region of the photo-mask being associated with the second part of the layer of photosensitive material;

developing the photosensitive material, so that the second part of the layer of photosensitive material is joined to the first part; and

smoothing the photosensitive material to form a contiguous deformity structure with a predetermined inclined angle.

Assignments (3)
CHANGE OF NAME Recorded Apr 3, 2014
From: CHIMEI INNOLUX CORPORATION
To: INNOLUX CORPORATION
Reel/Frame 032604/0487 →
MERGER Recorded May 5, 2010
From: CHI MEI OPTOELECTRONICS CORP.
To: CHIMEI INNOLUX CORPORATION
Reel/Frame 024329/0699 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2002
From: CHIEN, CHIN-CHENG; CHU, CHENG-JEN
To: CHI MEI OPTOELECTRONICS CORP.
Reel/Frame 013050/0716 →