Device for measuring parameters of an electronic device
The inherent capacitance between the substrate and the drain of an SOI device is utilized as part of a circuit. The substrate is connected to a sensing pin brought external to the chip, and other electronic components are hooked up to form a circuit that includes and operates with the inherent capacitance between the substrate and the drain.
1. An electronic device having a source, a gate and a drain, said electronic device being on a substrate, said electronic device and substrate being within a chip having external pins, said substrate being connected electrically to an external pin and not being connected to said source, and wherein a capacitance between the drain and the substrate further comprises a sensing mechanism.
2. The device of claim 1 further comprising a resistor connected between said substrate and said source, said resistor being internal to said chip.
3. The device of claim 2 wherein said resistor is connected at a common point to said substrate and to at least one logic gate for monitoring electrical activity at said point.
4. A semiconductor device comprising a conducting substrate layer, a semiconductor layer on the substrate layer, and a drain, said semiconductor device being on a chip and including a pin connected to the substrate layer and not to a source and extending to a point external to said chip, and wherein a capacitance between the drain and the substrate further comprises a sensing mechanism.
5. The semiconductor of claim 4 further comprising at least one logic gate connected to said point external to said chip.
6. The semiconductor device of claim 4 further comprising a resistor on said chip and connected between said source and said substrate.
7. The semiconductor device of claim 6 further comprising a measuring apparatus connected thereto.