IP Library › Granted Patent US 6,773,161
Granted Patent Utility
US 6,773,161 · Confirmation No. 7450

X-RAY DIAGNOSTIC APPARATUS

Inventor: Hideaki Tanaka
Patented Case View Patent ↗ View Publication ↗
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2004-06-28 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-03-29 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2004-03-29 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2004-03-29 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-03-29 SRFW Search information including classification, databases and other search related notes 1 View
2004-03-29 FWCLM Index of Claims 1 View
2004-02-26 WFEE Fee Worksheet (SB06) 1 View
2004-02-26 FWCLM Index of Claims 1 View
2004-02-12 A... Amendment/Request for Reconsideration-After Non-Final Rejection 1 View
2004-02-12 SPEC Specification 1 View
2004-02-12 ABST Abstract 1 View
2004-02-12 CLM Claims 2 View
2004-02-12 REM Applicant Arguments/Remarks Made in an Amendment 2 View
2004-02-12 XT/ Extension of Time 2 View
2003-10-17 CTNF Non-Final Rejection 10 View
2003-10-17 892 List of references cited by examiner 1 View
2003-10-17 1449 List of References cited by applicant and considered by examiner 1 View
2003-10-17 FWCLM Index of Claims 1 View
2003-10-17 SRFW Search information including classification, databases and other search related notes 1 View
2002-12-23 C.AD Change of Address 1 View
2002-07-26 TRNA Transmittal of New Application 2 View
2002-07-26 ADS Application Data Sheet 1 View
2002-07-26 SPEC Specification 23 View
2002-07-26 CLM Claims 4 View
2002-07-26 ABST Abstract 1 View
2002-07-26 DRW Drawings-only black and white line drawings 8 View
2002-07-26 OATH Oath or Declaration filed 2 View
2002-07-26 FRPR Certified Copy of Foreign Priority Application 30 View
2002-07-26 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2002-07-26 FOR Foreign Reference 13 View
2002-07-26 WFEE Fee Worksheet (SB06) 1 View
2002-07-26 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
Patent No.
US 6,773,161
App. No.
10/202,860
Filed
2002-07-26
Granted
2004-08-10
Pub. No.
US20030021386A1
Examiner
YUN, JURIE
Art Unit
2882
PTA
-26 days