IP Library Granted Patent US 6,984,421
Granted Patent B2
US 6,984,421 · App. 10/203,710 · Granted Jan 10, 2006

Encapsulation for an electrical component and method for producing the same

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Quick Facts
Patent No.
US 6,984,421
App. No.
10/203,710
Granted
Jan 10, 2006
Kind
B2
Abstract

Encapsulating a component structure includes applying a fluid, light-sensitive first reactive resin layer to a surface of a component substrate containing the component structure, exposing and developing the first reactive resin layer so as to form a frame structure that encloses the component structure, covering the frame structure with an auxiliary foil, applying a second reactive resin layer to a surface of the auxiliary foil so as to form ceiling structures on the surface of the auxiliary foil, at least one of the ceiling structures making a seal with the frame structure, and removing the auxiliary foil in areas between ceiling structures.

Claims (32)

1. A method of encapsulating a component structure, comprising the following steps performed in order:

applying a first reactive resin layer to a surface of a component substrate containing the component structure, the first reactive resin layer comprising a light-sensitive fluid;

exposing and developing the first reactive resin layer so as to form a frame structure that encloses the component structure;

covering the frame structure with an auxiliary foil;

applying a second reactive resin layer comprising a fluid to a surface of the auxiliary foil so as to form ceiling structures on the surface of the auxiliary foil, at least one of the ceiling structures making a seal with the frame structure;

causing the second reactive resin layer to harden;

removing the auxiliary foil only in areas between ceiling structures.

2. A method according to claim 1 , wherein applying the second reactive resin layer comprises:

spin-coating the second reactive resin layer onto an entire surface of the auxiliary foil, the second reactive resin layer comprising a light-sensitive fluid; and

exposing and developing the second reactive resin layer so as to form the ceiling structures, at least one of the ceiling structures forming a cavity with the frame structure.

3. A method according to claim 2 , wherein exposing at least one of the first reactive resin layer and the second reactive resin layer is performed using a laser.

4. A method according to claim 2 , wherein developing at least one of exposed first and second reactive resin layers is performed using a fluid developer.

5. A method according to claim 1 , wherein the second reactive resin layer is applied in a structured manner to the surface of the auxiliary foil by directly printing ceiling structures onto the surface of the auxiliary foil.

6. A method according to claim 1 , wherein the ceiling structures are formed and then cured using one of a screen and stencil printing process.

7. A method according to claim 1 , wherein the auxiliary foil comprises thin plastic.

8. A method according to claim 1 , further comprising fixing the auxiliary foil to the frame structure using at least one of an adhering process and a fusing process.

9. A method according to claim 1 , wherein removing is performed using an incineration treatment and plasma.

10. A method according to claim 1 , wherein removing is performed using a solvent.

11. A method according to claim 1 , further comprising forming damping structures on the component substrate during exposing and developing.

12. A method according to claim 1 , wherein the auxiliary foil comprises at least one of polyamide, PET and polycarbonate and has a thickness of 0.5 to 5 μm.

13. A method according to claim 1 , wherein the first and second reactive resin layers comprise a UV-cured epoxy resin.

14. A method of encapsulating a wafer, comprising the following steps performed in order:

applying a first reactive resin layer to a surface of the wafer, the first reactive resin layer comprising a light-sensitive fluid;

exposing and developing the first reactive resin layer so as to form a frame structure that encloses the wafer;

covering the frame structure with an auxiliary foil, the auxiliary foil comprising a thin plastic;

applying a second reactive resin layer comprising a fluid to a surface of the auxiliary foil so as to form ceiling structures on the surface of the auxiliary foil, at least one of the ceiling structures making a seal with the frame structure;

hardening the second reactive resin layer; and

removing the auxiliary foil only in areas between ceiling structures.

15. A method according to claim 14 , wherein applying the second reactive resin layer comprises:

spin-coating the second reactive resin layer onto an entire surface of the auxiliary foil, the second reactive resin layer comprising a light-sensitive fluid; and

exposing and developing the second reactive resin layer so as to form the ceiling structures, at least one of the ceiling structures forming a cavity with the frame structure.

16. A method according to claim 14 , wherein the ceiling structures are formed and then cured using one of a screen and stencil printing process.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2017
From: EPCOS AG; TDK CORPORATION
To: SNAPTRACK, INC.
Reel/Frame 041163/0110 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ORIGINALLY RECORDED ASSIGNMENT DOCUMENT PREVIOUSLY RECORDED ON REEL 013802 FRAME 0483. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Nov 29, 2016
From: PAHL, WOLFGANG; FISCHER, WALTER
To: EPCOS AG
Reel/Frame 040718/0470 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2003
From: PAHL, WOLFGANG; FISCHER, WALTER
To: EPCOS AG
Reel/Frame 013802/0483 →