IP Library Granted Patent US 7,240,564
Granted Patent B2
US 7,240,564 · App. 10/208,518 · Granted Jul 10, 2007

Method and apparatus for detecting and determining event characteristics with reduced data collection

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Quick Facts
Patent No.
US 7,240,564
App. No.
10/208,518
Granted
Jul 10, 2007
Kind
B2
Abstract

A method and apparatus for detecting and determining event characteristics such as, for example, the material failure of a component, in a manner which significantly reduces the amount of data collected. A sensor array, including a plurality of individual sensor elements, is coupled to a programmable logic device (PLD) configured to operate in a passive state and an active state. A triggering event is established such that the PLD records information only upon detection of the occurrence of the triggering event which causes a change in state within one or more of the plurality of sensor elements. Upon the occurrence of the triggering event, the change in state of the one or more sensor elements causes the PLD to record in memory which sensor element detected the event and at what time the event was detected. The PLD may be coupled with a computer for subsequent downloading and analysis of the acquired data.

Claims (66)

1. An apparatus for monitoring and detecting event characteristics comprising:

a sensor array including a plurality of sensor elements; and

a programmable logic device (PLD) operatively coupled to the plurality of sensor elements, the PLD being configured to operate in a default passive state and an event-triggered active state, wherein the PLD is configured to record data from the sensor array only during the event-triggered active state.

2. The apparatus of claim 1 , wherein a change in state occurring in any of the plurality of sensor elements causes the PLD to switch from the default passive state to the event-triggered active state.

3. The apparatus of claim 2 , wherein the PLD includes a memory component having a plurality of memory locations, each of the plurality of memory locations being associated with an individual one of the plurality of sensor elements.

4. The apparatus of claim 3 , wherein the PLD is configured such that a change in state of one of the plurality of sensor elements is detected by the PLD and data associated with the change in state is stored in the associated memory location of the one of the plurality of sensor elements.

5. The apparatus of claim 4 , wherein the data associated with the change in state includes the time at which the change in state occurred.

6. The apparatus of claim 5 , wherein the PLD is configured to be operatively coupled with a computer.

7. The apparatus of claim 2 , wherein the PLD includes a field-programmable gate array (FPGA) device.

8. The apparatus of claim 7 , wherein the plurality of sensor elements includes a plurality of conductors configured to break upon a detection of a predefined event to indicate the change in state.

9. The apparatus of claim 8 , wherein the plurality of sensor elements are disposed on a thin sheet of dielectric material.

10. The apparatus of claim 9 , wherein the thin sheet of dielectric material includes a polyimide material.

11. The apparatus of claim 9 , wherein the thin sheet of dielectric material exhibits a thickness of approximately 0.001 inch at a first portion thereof which is distally located relative to the FPGA device.

12. The apparatus of claim 11 , wherein the thin sheet of dielectric material tapers in thickness from the first portion to a second portion which is adjacent the FPGA device.

13. The apparatus of claim 12 , wherein the thin sheet of dielectric material exhibits a thickness of approximately 0.003 inch in the second portion.

14. The apparatus of claim 9 , wherein the plurality of conductors are disposed on the thin sheet of dielectric material in a substantially parallel manner.

15. The apparatus of claim 14 , wherein the plurality of conductors exhibits substantially equal spacing from one another.

16. The apparatus of claim 15 , wherein the plurality of conductors are spaced approximately 0.050 inch from one another.

17. The apparatus of claim 1 , wherein the PLD includes a simple programmable logic device.

18. The apparatus of claim 1 , wherein the PLD includes a complex programmable logic device.

19. The apparatus of claim 1 , wherein the plurality of sensor elements are photosensitive.

20. The apparatus of claim 18 , further comprising a light source configured and positioned to provide light to the plurality of sensor elements.

21. The apparatus of claim 1 , wherein the plurality of sensor elements includes a plurality of magnetic sensors.

22. The apparatus of claim 1 , wherein the plurality of sensor elements includes a plurality of piezoelectric transducers.

23. The apparatus of claim 1 , wherein the PLD includes a timing device having a resolution of at least approximately 10 −6 seconds.

24. A system for determining fracture characteristics of an adhesive material comprising:

a test specimen including a first member and a second member coupled together with the adhesive material;

a load-applying apparatus including at least one load-applying member configured to apply a load to the test specimen such that the first and second members are loaded in a cantilevered manner;

a plurality of break-wire conductors coupled to the test specimen; and

a programmable logic device (PLD) operatively coupled to the plurality of break-wire conductors configured to operate in a default passive state and an event-triggered active state such that upon breaking of one of any of the plurality of break-wire conductors the PLD switches from the default passive state to the event-triggered active state, wherein the PLD while in the event-triggered active state is configured to record information in memory regarding which of the break-wire conductors broke and at what time the break-wire conductor broke.

25. The system of claim 24 , wherein the plurality of break-wire conductors includes copper conductors.

26. The system of claim 25 , wherein the plurality of break-wire conductors are disposed on a thin dielectric sheet and wherein the thin dielectric sheet is adhered to the test specimen such that the plurality of break-wire conductors traverses a bond line formed by the adhesive material between the first member and the second member.

27. The system of claim 26 , wherein the plurality of break-wire conductors are arranged to be substantially perpendicular to the bond line.

28. The system of claim 26 , wherein the thin dielectric sheet includes a polyimide material.

29. The system of claim 26 , wherein a portion of the thin dielectric sheet is coupled to the test specimen with an adhesive.

30. The system of claim 29 , wherein the portion of the thin dielectric sheet coupled to the test specimen exhibits a material thickness of approximately 0.001 inch.

31. The system of claim 30 , wherein the thin dielectric sheet exhibits a thickness of approximately 0.003 inch in a portion thereof which is located adjacent the PLD.

32. The system of claim 26 , wherein the plurality of break-wire conductors are arranged in a substantially parallel manner.

33. The system of claim 32 , wherein the plurality of break-wire conductors exhibits a spacing of approximately 0.050 inch from one another.

34. The system of claim 25 , wherein the PLD includes a field-programmable gate array (FPGA).

35. The system of claim 25 , wherein the PLD is configured to be operatively coupled to a computer.

36. The system of claim 24 , wherein the PLD includes a timing mechanism which has a resolution of at least approximately 10 −6 seconds.

37. A method of monitoring an event, the method comprising:

establishing an event trigger;

providing a plurality of sensor elements, each configured to individually detect the event trigger;

providing a programmable logic device (PLD) and configuring the PLD to operate in a default passive state and an event-triggered active state; and

storing data representative of one or more signals produced by any of the plurality of sensor elements only while the PLD is in the event-triggered active state, wherein storing data includes storing data regarding detection of the event trigger including which of the plurality sensor elements detected the event trigger and at what time the event trigger was detected thereby.

38. The method according to claim 37 , wherein storing the time the event trigger was detected includes storing the time at a resolution of at least approximately 10 −6 seconds.

39. The method according to claim 37 , wherein providing a plurality of sensor elements includes providing a plurality of break-wire conductors and configuring the plurality of break-wire conductors to individually break upon the detection of the event trigger thereby.

40. The method according to claim 37 , further comprising establishing the event trigger as a change in pressure.

41. The method according to claim 37 , further comprising establishing the event trigger as a change in a magnetic field.

42. The method according to claim 37 , further comprising establishing the event trigger as a change in a light field.

43. The method according to claim 37 , further comprising downloading the stored data to a computer.

44. A method of monitoring an event, the method comprising:

establishing an event trigger;

providing a plurality of sensor elements, each configured to individually detect the event trigger;

providing a programmable logic device (PLD) and configuring the PLD to operate in a default passive state and an event-triggered active state;

upon a detection of the event trigger, storing data associated with detection of the event trigger including which of the plurality of sensor elements detected the event trigger and at what time the event trigger was detected thereby;

downloading the stored data to a computer; and

making a time map representative of the downloaded data.

45. A monitoring apparatus comprising:

a plurality of sensors configured to detect a specified event;

a programmable logic device (PLD) configured to operate in a passive state and an active state such that, when in the passive state the PLD stores no data and, when in the active state, the PLD stores in associated memory discrete and discriminate data associated with selective ones of the plurality of sensors.

46. The apparatus of claim 45 , wherein the PLD switches from the passive state to the active state upon detection of the specified event by at least one of the plurality of sensors.

47. The apparatus of claim 46 , wherein the PLD includes a field-programmable gate array (FPGA).

48. The apparatus of claim 45 , wherein the PLD is configured to be operatively coupled with a computer.

Assignments (13)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 8, 2021
From: NORTHROP GRUMMAN INNOVATION SYSTEMS LLC
To: NORTHROP GRUMMAN SYSTEMS CORPORATION
Reel/Frame 055256/0892 →
CHANGE OF NAME Recorded Feb 4, 2021
From: NORTHROP GRUMMAN INNOVATION SYSTEMS, INC.
To: NORTHROP GRUMMAN INNOVATION SYSTEMS LLC
Reel/Frame 055223/0425 →
CHANGE OF NAME Recorded Nov 1, 2018
From: ORBITAL ATK, INC.
To: NORTHROP GRUMMAN INNOVATION SYSTEMS, INC.
Reel/Frame 047400/0381 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Jun 6, 2018
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
To: ORBITAL ATK, INC.
Reel/Frame 046477/0874 →
RELEASE OF SECURITY INTEREST Recorded Oct 8, 2015
From: BANK OF AMERICA, N.A.
To: ALLIANT TECHSYSTEMS INC.; FEDERAL CARTRIDGE CO.; EAGLE INDUSTRIES UNLIMITED, INC.; AMMUNITION ACCESSORIES, INC.; ORBITAL ATK, INC. (F/K/A ALLIANT TECHSYSTEMS INC.)
Reel/Frame 036816/0624 →
RELEASE OF SECURITY INTEREST Recorded Oct 5, 2015
From: BANK OF AMERICA, N.A.
To: ALLIANT TECHSYSTEMS INC.
Reel/Frame 036726/0385 →
SECURITY AGREEMENT Recorded Sep 30, 2015
From: ORBITAL ATK, INC.; ORBITAL SCIENCES CORPORATION
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 036732/0170 →
CHANGE OF NAME Recorded May 22, 2015
From: ALLIANT TECHSYSTEMS INC.
To: ORBITAL ATK, INC.
Reel/Frame 035753/0373 →
SECURITY AGREEMENT Recorded Nov 26, 2013
From: ALLIANT TECHSYSTEMS INC.; CALIBER COMPANY; EAGLE INDUSTRIES UNLIMITED, INC.; FEDERAL CARTRIDGE COMPANY; SAVAGE ARMS, INC.; SAVAGE RANGE SYSTEMS, INC.; SAVAGE SPORTS CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 031731/0281 →
SECURITY AGREEMENT Recorded Nov 4, 2010
From: ALLIANT TECHSYSTEMS INC.; AMMUNITION ACCESSORIES INC.; ATK COMMERCIAL AMMUNITION COMPANY INC.; ATK COMMERCIAL AMMUNITION HOLDINGS COMPANY; ATK LAUNCH SYSTEMS INC.; ATK SPACE SYSTEMS INC.; FEDERAL CARTRIDGE COMPANY; EAGLE INDUSTRIES UNLIMITED, INC.; EAGLE MAYAGUEZ, LLC; EAGLE NEW BEDFORD, INC.
To: BANK OF AMERICA, N.A.
Reel/Frame 025321/0291 →
SECURITY INTEREST Recorded May 28, 2004
From: ALLIANT TECHSYSTEMS INC.; ALLIANT AMMUNITION AND POWDER COMPANY LLC; ALLIANT AMMUNITION SYSTEMS COMPANY LLC; ALLIANT HOLDINGS LLC; ALLIANT INTERNATIONAL HOLDINGS INC.; ALLIANT LAKE CITY SMALL CALIBER AMMUNITION COMPANY LLC; ALLIANT PROPULSION AND COMPOSITES LLC; ALLIANT SOUTHERN COMPOSITES COMPANY LLC; AMMUNITION ACESSORIES INC.; ATK AEROSPCE COMPANY INC.; ATK AMMUNITION AND RELATED PRODUCTS LLC; ATK COMMERICAL AMMUNITION COMPANY INC.; ATK ELKTON LLC; ATK INTERNATIONAL SALES INC.; ATK LOGISTICS AND TECHNICAL SERVICES LLC; ATK MISSILE SYSTEMS COMPANY LLC; ATK ORDNANCE AND GROUND SYSTEMS LLC; ATK PRECISION SYSTEMS LLC; ATK TACTICAL SYSTEMS COMPANY LLC; COMPOSITE OPTICS, INCORPORATED; FEDERAL CARTRIDGE COMPANY; GASL, INC.; MICRO CRAFT INC.; MISSION RESEARCH CORPORATION; NEW RIVER ENERGETICS,INC.; THIOKOL TECHNOLOGIES INTERNATIONAL, INC.
To: BANK OF AMERICA, N.A.
Reel/Frame 014729/0574 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2002
From: TOTMAN, PETER D.
To: ALLIANT TECHSYSTEMS INC.
Reel/Frame 013508/0358 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2002
From: EVERTON, RANDY L.; EGGET, MARK R.; MACON, DAVID J.
To: ALLIANT TECHSYSTEMS INC.
Reel/Frame 013161/0784 →