IP Library Granted Patent US 6,935,913
Granted Patent B2
US 6,935,913 · App. 10/214,716 · Granted Aug 30, 2005

Method for on-line testing of a light emitting panel

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 6,935,913
App. No.
10/214,716
Granted
Aug 30, 2005
Kind
B2
Abstract

A method of testing a light-emitting panel and the component parts therein including an assembled web containing light-emitting micro-components is disclosed. The method utilizes radiometric measuring devices disposed throughout a continuous fabrication process. Qualities of the components are measured so that product defects or process deficiencies can be corrected or eliminated.

Claims (79)

1. A method for on-line testing micro-components within an assembled web during continuous manufacturing of the assembled web, the method comprising:

passing at least a portion of the assembled web within a field of view of at least one radiometric output measuring device;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

processing of the assembled web in accordance with the analysis.

2. A method for on-line testing micro-components within an assembled web during continuous manufacturing of the assembled web the method comprising:

passing at least a portion of the assembled web within a field of view of at least one radiometric output measuring device;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence by directing an electron beam to a selected ea of the assembled web;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

processing of the assembled web in accordance with the analysis.

3. The method of claim 1 , wherein a plurality of selected micro-components are excited.

4. The method of claim 1 , wherein the step of analyzing the detected radiation includes identifying an absence of luminescence from the selected micro-component.

5. The method of claim 4 , further comprising disposing of the assembled web comprises removing sections of the assembled web containing the micro-component having no luminescence.

6. A method for on-line testing micro-components within an assembled web during continuous manufacturing of the assembled web the method comprising:

passing at least a portion of the assembled web within a field of view of at least one radiometric output measuring device;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation by identifying an absence of luminescence from the selected micro-component; and

processing of the assembled web in accordance with the analysis by disposing of the assembled web comprises removing the micro-component having no luminescence from the assembled web rid adding a replacement micro-component to the web at a location vacated by the removed micro-component.

7. The method of claim 1 , wherein the step of analyzing the detected radiation comprises:

determining the existing or absence of radiation;

determining the color of the radiation; and,

determining the intensity of the radiation.

8. A method for on-line testing micro-components within an assembled web during continuous manufacturing of the assembled web, the method comprising:

passing at least a portion of the assembled web within a field of view of at least one radiometric output measuring device;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation including

determining the existing or absence of radiation;

determining the color of the radiation;

determining the intensity of the radiation;

determining locations on the assembled web where a first colored micro-component is transposed within a second colored micro-component; and

processing of the assembled web in accordance with the analysis by switching the first and second micro-components.

9. A method for on-line testing micro-components within an assembled web during continuous manufacturing of the assembled web, the method comprising:

passing at least a portion of the assembled web within a field of view of at least one radiometric output measuring device wherein the radiometric measuring device is a high resolution electronic camera;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

processing of the assembled web in accordance with the analysis.

10. A method for on-line testing micro-components within an assembled web during continuous manufacturing of the assembled web, the method comprising:

passing at least a portion of the assembled web within a field of view of at least one radiometric output measuring device wherein the radiometric measuring device has a resolution sufficient to resolve a single micro-component in the assembled web;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

processing of the assembled web in accordance with the analysis.

11. A method for on-line testing micro-components within an assembled web during continuous manufacturing of the assembled web the method comprising:

passing at least a portion of the assembled web within a field of view of at least one radiometric output measuring device wherein the radiometric measuring device can scan the assembled web using either line imaging or area imaging;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

processing of the assembled web in accordance with the analysis.

12. A method for on-line testing of a plurality of micro-components within an assembled web during a continuous manufacturing process of the assembled web, the method comprising:

passing at least a portion of the assembled web within a field of view of a plurality of radiometric output measuring devices disposed at various locations throughout the continuous manufacturing process;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

disposing of the assembled web in accordance with the analysis.

13. The method of claim 12 , wherein a plurality of micro-components are excited.

14. The method of claim 12 , wherein the entire assembled web is passed within the field of view and all of the micro-components within the field of view are excited.

15. The method of claim 14 , further comprising accumulating a length of the assembled web within the field of view.

16. The method of claim 12 , wherein the plurality of radiometric output measuring devices are each connected to a central processor and the step of analyzing the detected radiation is conducted by he central processor.

17. A method of on-line testing a light-emitting panel during continuous manufacturing o the panel, the method comprising:

passing at least a portion of the light-emitting panel within a field of view of at least one radiometric measuring device;

exciting at least one selected micro-component disposed on the light-emitting panel within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and,

disposing of the light-emitting panel in accordance with the analysis.

18. The method of claim 17 , wherein the step of analyzing the detected radiation comprises:

determining the existence or absence of radiation;

determining the color of the radiation;

determining the intensity of the radiation; and,

logging occurrences of absence of radiation, improper color or inadequate intensity; and

the step of disposing of the light-emitting panel comprises;

using display programming to compensate for the absence of radiation, improper color, or inadequate intensity.

19. The method of claim 17 wherein:

the light emitting panel comprises an arrangement of electrodes and control circuitry to address individual micro-components within the panel; and,

the step of exciting further comprises using the electrodes and control circuitry to excite at least one micro-component.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Jan 17, 2020
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: LEIDOS, INC.
Reel/Frame 051632/0742 →
RELEASE OF SECURITY INTEREST Recorded Jan 17, 2020
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: LEIDOS, INC.
Reel/Frame 051632/0819 →
SECURITY INTEREST Recorded Aug 25, 2016
From: LEIDOS, INC.
To: CITIBANK, N.A.
Reel/Frame 039809/0801 →
SECURITY INTEREST Recorded Aug 25, 2016
From: LEIDOS, INC.
To: CITIBANK, N.A.
Reel/Frame 039818/0272 →
CHANGE OF NAME Recorded Apr 10, 2014
From: SCIENCE APPLICATIONS INTERNATIONAL CORPORATION
To: LEIDOS, INC.
Reel/Frame 032655/0256 →