System for, and method of, irradiating opposite sides of an article
View Patent ↗An accelerator directs an electron beam to a scanner which operates under microprocessor control to convert the beam into two (2) sets of spaced electron beamlets. A magnetic lens deflects the sets of beamlets to a spaced and substantially parallel relationship. A first dipole directs the first set of beamlets in a first direction to a first side of an article. A second dipole directs the second set of beamlets, in a second direction opposite to the first direction, to a second side of the article opposite to the first side of the article. In this way, a single accelerator irradiates two (2) opposite sides of the article with an enhanced precision, simplified controls, a significantly reduced number of components and reduced costs relative to the systems of the prior art. The electron beam may be converted to an x-ray beam which is then processed in the manner described above.
1. In combination for irradiating an article from first and second opposite sides of the article,
an accelerator for providing an energy beam,
a scanner for scanning the beam of energy to provide first and second sets of beamlets,
a magnetic lens for directing the first and second sets of beamlets in a particular direction, and
dipoles for respectively directing the sets of beamlets from the magnetic lens to the first and second opposite sides of the article.
2. In a combination as set forth in claim 1 wherein
the scanner is operative on a cyclic basis to provide the first and second sets of beamlets and wherein the first set of beamlets is separated from the second set of beamlets.
3. In combination as set forth in claim 1 wherein
the formation of the first and second sets of beamlets from the beam is provided by a microprocessor.
4. In combination as set forth in claim 1 wherein
the accelerator provides the beam in a first direction and wherein
a conveyor is provided to convey the article through the beamlets from the accelerator in a second direction substantially perpendicular to the first direction and wherein
the scanner scans the beamlets in a third direction substantially perpendicular to the first and second directions.
5. In combination as set forth in claim 2 wherein
a microprocessor is operative on the cyclic basis to provide the first and second sets of beamlets in the spaced relationship and wherein
the accelerator provides the beam in a first direction and
a conveyor is provided to convey the article through the beamlets in a second direction substantially perpendicular to the first direction and wherein
the scanner scans the beamlets in a third direction substantially perpendicular to the first and second directions.
6. In combination as set forth in claim 1 wherein the beam and the beamlets are formed from electrons.
7. In combination as set forth in claim 1 wherein
the electron beamlets are convened to x-rays.
8. In combination as set forth in claim 1 wherein
the magnetic structure directs the first set of beamlets to the first side of the article and directs the second set of beamlets to the second side of the article.
9. In combination as set forth in claim 5 wherein
the scanner is magnetic and wherein the scanner is controlled by a microprocessor.
10. In combination for irradiating an article from first and second opposite sides of the article,
an accelerator for providing a beam of electrons,
a scanner for scanning the beam of electrons to provide first and second sets of electron beamlets,
a magnetic lens for directing the first and second sets of electron beamlets in a particular direction, and
dipoles for respectively directing the electron beamlets from the magnetic lens to the first and second opposite sides of the article.
11. In combination as set forth in claim 10 wherein
the scanner is operative on a cyclic basis to provide the first and second electron beamlets and wherein the first set of beamlets is spaced from the second set of beamlets.
12. In combination as set forth in claim 11 wherein
a microprocessor is operative on the cyclic basis to provide the first and second sets of electron beamlets in the spaced relationship.
13. In combination as set forth in claim 10 wherein
the accelerator provides the electron beam in a first direction and wherein
a conveyor is provided to convey the article through the electron beamlets from the accelerator
in a second direction substantially perpendicular to the first direction and wherein the scanner scans the electron beamlets in a third direction substantially perpendicular to the first and second directions.
14. In combination as set forth in claim 11 wherein
a microprocessor is operative on the cyclic basis to provide the first and second sets of electron beamlets in the spaced relationship and wherein
the accelerator provides the electron beamlets in a first direction and
a conveyor is provided to convey the article through the electron beamlets from the accelerator in a second direction substantially perpendicular to the first direction and wherein
the scanner scans the electron beamlets in a third direction substantially perpendicular to the first and second directions.
15. In combination as set forth in claim 14 wherein
the scanner is operative on a cyclic basis to provide the first and second sets of electron beamlets in the spaced relationship.
16. In combination as set forth in claim 14 wherein the electron beamlets are converted to x-ray beams.
17. In combination as set forth in claim 14 wherein the scanner is magnetic and wherein the scanner is controlled by a microprocessor.
18. In combination as set forth in claim 10 wherein
there are two (2) dipoles and wherein
the dipoles are magnetic.
19. In a combination as set forth in claim 18 wherein
the scanner is magnetic and wherein the scanner is controlled by a microprocessor and wherein
there are two (2) dipoles and wherein
the dipoles are magnetic.