Granted Patent
Utility
US 6,603,325
· Confirmation No. 2864
CONTACTOR FOR SEMICONDUCTOR DEVICES, A TESTING APPARATUS USING SUCH CONTACTOR, A TESTING METHOD USING SUCH CONTACTOR, AND A METHOD OF CLEANING SUCH CONTACTOR
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2002-08-22 | TRNA |
Transmittal of New Application | 3 | View | |
| 2002-08-22 | SPEC |
Specification | 39 | View | |
| 2002-08-22 | CLM |
Claims | 4 | View | |
| 2002-08-22 | ABST |
Abstract | 1 | View | |
| 2002-08-22 | DRW |
Drawings-only black and white line drawings | 19 | View | |
| 2002-08-22 | OATH |
Oath or Declaration filed | 5 | View |
Inventors
Shigeyuki Maruyama
Kawasaki-shi, JAPAN
Futoshi Fukaya
Kawasaki-shi, JAPAN
Makoto Haseyama
Kawasaki-shi, JAPAN
Attorneys & Agents of Record
Classification
USPC
324/761
H10P72/78
H10P74/00
H10P72/0441
H10P72/7624
H10P72/7611
G01R1/07314
G01R31/2831
G01R31/2886
Prosecution
- Examiner
- HOLLINGTON, JERMELE M
- Art Unit
- 2829
- Customer No.
- 23850
- Docket No.
- 990882A
- Confirmation No.
- 2864
Foreign Priority
10-361618
·
1998-12-18
·
JAPAN
Publication
- Pub. No.
- US20020190741A1
- Pub. Date
- 2002-12-19
Patent Term Adjustment
0days
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2015-04-27
CHANGE OF NAME
Recorded 2010-08-02
from
FUJITSU LIMITED
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2008-12-05
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Quick Facts
- Patent No.
- US 6,603,325
- App. No.
- 10/225,133
- Filed
- 2002-08-22
- Granted
- 2003-08-05
- Pub. No.
- US20020190741A1
- Examiner
- HOLLINGTON, JERMELE M
- Art Unit
- 2829
- PTA
- 0 days
External Links