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App. No. 10/226,110 · Confirmation No. 3641

Method for reducing surface roughness of polysilicon films for liquid crystal displays

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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2004-08-06 ABN Abandonment 2 View
2004-08-06 BIB Bibliographic Data Sheet 1 View
2004-03-10 OATH Oath or Declaration filed 1 View
2004-03-10 XT/ Extension of Time 1 View
2003-11-10 CTNF Non-Final Rejection 5 View
2003-11-10 1449 List of References cited by applicant and considered by examiner 1 View
2003-11-10 892 List of references cited by examiner 1 View
2003-11-10 FWCLM Index of Claims 1 View
2003-11-10 SRFW Search information including classification, databases and other search related notes 1 View
2003-10-30 SRNT Examiner's search strategy and results 1 View
2003-01-21 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2002-08-23 TRNA Transmittal of New Application 3 View
2002-08-23 SPEC Specification 6 View
2002-08-23 CLM Claims 3 View
2002-08-23 ABST Abstract 1 View
2002-08-23 DRW Drawings-only black and white line drawings 1 View
2002-08-23 OATH Oath or Declaration filed 2 View
2002-08-23 WFEE Fee Worksheet (SB06) 1 View
2002-08-23 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
10/226,110
Filed
2002-08-23
Pub. No.
US20040038438A1
Art Unit
2812