Evaluation system and method of measuring a quantitative magnetic field of a magnetic material

1. A magnetic property evaluating system of a sample of a magnetic material comprising:

a probe having a magnetic material at a tip portion; means for oscillating the probe at an oscillating frequency;

means for controlling a distance between the tip portion of the probe and a sample to be measured;

means for supplying a sensing current to the sample of the magnetic material;

means for receiving an output signal from the sample and extracting a component of the output signal synchronized with the oscillating frequency; and

means for calculating that processes an output signal of the extracting means including calculating a distribution of a magnetic field of the sample to be measured by subtracting an output signal of the extracting means with the probe being scanned in a first state from an output signal of the extracting means with the probe being scanned in a second state, wherein the tip portion of the probe is in tapping contact with a measured surface of the sample to be measured by the means for oscillating the probe in the first state, and wherein the tip portion of the probe is kept in contact with the measured surface of the sample to be measured in the second state.

2. A magnetic property evaluating system of a sample of a magnetic material according to claim 1 , further comprising:

a storage device for storing an intensity of a magnetic field of the probe;

wherein the processor calculates the distribution of the magnetic field of the sample by removing the magnetic field from the output signal of the extracting means measured in the first state.

3. A magnetic property evaluating system of a sample of a magnetic material according to claim 2 ,

wherein Laplace transformation and inverse Laplace transformation are performed as operations of removing the intensity of the magnetic field of the probe.

4. A magnetic property evaluating system of a sample of a magnetic material according to claim 2 , further comprising:

means for measuring the intensity of the magnetic field of the probe.

5. A magnetic property evaluating system of a sample of a magnetic material according to claim 4 ,

wherein the means of measuring the intensity of the magnetic field of the probe is an apparatus using electron beam tomography.

6. A magnetic property evaluating system of a sample of a magnetic material according to claim 1 , further comprising:

a means of controlling an oscillation amplitude of the probe as a means of controlling the distance between the tip portion of the probe and the sample to be measured.

7. A magnetic property evaluating system of a sample of a magnetic material according to claim 1 , further comprising:

a light source for irradiating light to the probe; and

a photo detector for detecting reflected light from the probe.

8. A magnetic property evaluating system of a sample of a magnetic material according to claim 1 ,

wherein the sample of the magnetic material is a magnetoresistive device, and a change in a resistance of the magnetoresisitive device is read in a form of a change in the voltage.

9. A magnetic property evaluating system of a sample of a magnetic material, said system comprising:

a probe having a magnetic material at a tip portion;

a piezoelectric element for oscillating the probe;

a frequency generator for applying a voltage at a predetermined frequency to the piezoelectric element;

a lock-in amp using a frequency of a voltage generated by the frequency generator as a reference frequency and using the voltage from the sample as an input signal;

a power source for supplying a sensing current to the sample;

means for controlling a distance between the tip portion of the probe and the sample to be measured; and

a processor that processes an output signal from the lock-in amp;

wherein the processor calculates a distribution of a magnetic field of the sample by subtracting a first output signal of the lock-in amp measured in a state of scanning the probe in a state in which the tip portion taps a measured surface of the sample by oscillating the probe with the piezoelectric element from a second output signal of the lock-in amp measured in a state of scanning the probe while maintaining the tip portion in contact with the measured surface of the sample.

10. A magnetic property evaluating system of a sample of a magnetic material according to claim 9 , wherein the sample of the magnetic material is a magnetoresistive device, and a change in a resistance of the magnetoresisitive device is read in a form of a change in the voltage.

11. A magnetic property evaluating method of a sample of a magnetic material comprising the steps of:

applying sensing current to a sample of a magnetic material;

measuring a change in a voltage by applying the sensing current to the sample of the magnetic material in a first state in which a probe having a magnetic material at a tip portion thereof is scanned while maintaining the tip portion in contact with a measured surface of the sample of the magnetic material;

measuring a change in a voltage by applying the sensing current to the sample of the magnetic material in a second state in which the probe is scanned in a state in which the tip taps on the measured surface of the sample by oscillating the probe;

extracting a frequency component having an oscillating frequency equal to an oscillating frequency of the probe from a waveform of the voltage measured in the second state; and

calculating a distribution of a magnetic field of the sample of the magnetic material by subtracting the extracted waveform of the voltage from a waveform of the voltage measured in the first state.

12. A magnetic property evaluating method of a sample of a magnetic material according to claim 11 ,

wherein a distribution of the magnetic field of the sample of the magnetic material is measured by extracting the frequency component having the same oscillating frequency as the oscillating frequency of the probe from the waveform of the voltage measured in the first state and subtracting the frequency component extracted from the waveform of the voltage measured in the second state from the frequency component extracted from the waveform of the voltage measured in the first state.

13. A magnetic property evaluating method of a sample of a magnetic material according to claim 12 ,

wherein an intensity of a magnetic field of the probe is removed from the waveform of the voltage measured in the second state.

14. A magnetic property evaluating method of a sample of a magnetic material according to claim 13 ,

wherein Laplace transformation and inverse Laplace transformation are performed as operations of removing the intensity of the magnetic field of the probe from the waveform of the voltage measured in the second state.

15. A magnetic property evaluating method of a sample of a magnetic material according to claim 14 ,

wherein the intensity of the magnetic field of the probe is measured by using an electron beam tomography technique.

16. A magnetic property evaluating method of a sample of a magnetic material according to claim 13 , further comprising the steps of:

calculating an estimated value B of the distribution of the magnetic field of the sample of the magnetic material which had a distrubution of a magnetic field of the probe removed;

calculating an estimated value B′ of the distribution of the magnetic field of the sample of the magnetic material at a position apart from the measured surface by the length of the amplitude of the probe based on the estimated value B;

calculating a difference of the distribution of the magnetic field of the sample of the magnetic material at a position apart from the measured surface by the length of the amplitude of the probe and the estimated value B′; and

comparing the difference and a predetermined set value;

wherein when the difference is equal to or smaller than a predetermined set value, the estimated value B is set to the distribution of the magnetic field of the sample of the magnetic material which had a distribution of a magnetic field of the probe removed and when the difference exceeds the predetermined set value, correcting the estimated value B.

17. A magnetic property evaluating method of a sample of a magnetic material according to Claim 11 ,

wherein the sample of the magnetic material is a magnetoresistive device, and a change in a resistance of the magnetoresisitive device is read in a form of the change in the voltage.