IP Library Granted Patent US 7,255,746
Granted Patent B2
US 7,255,746 · App. 10/233,625 · Granted Aug 14, 2007

Nitrogen sources for molecular beam epitaxy

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Quick Facts
Patent No.
US 7,255,746
App. No.
10/233,625
Granted
Aug 14, 2007
Kind
B2
Abstract

MBE nitrogen sources of dimethylhydrazine, tertiarybutlyhydrazine, nitrogentrifloride, and NHx radicals. Those nitrogen sources are beneficial in forming nitrogen-containing materials on crystalline subtrates using MBE. Semiconductor lasers in general, and VCSEL in particular, that have nitrogen-containing layers can be formed using such nitrogen sources.

Claims (32)

1. A method of performing molecular beam epitaxy, comprising:

locating a crystalline substrate in a chamber;

heating the crystalline substrate to a temperature suitable for MBE epitaxial growth;

evacuating the chamber to a pressure suitable for MBE epitaxial growth; and

injecting tertiarybutylhydrazine into the chamber and onto a surface of the crystalline substrate.

2. A method according to claim 1 , wherein a nitrogen-containing layer is formed on the crystalline substrate.

3. A method according to claim 1 , wherein the injected material is injected from an effusion cell.

4. A method according to claim 1 , wherein the injected material forms a gaseous beam.

5. A method according to claim 1 , wherein a nitrogen-containing layer is formed on a surface of the crystalline substrate.

6. A method according to claim 1 , wherein a surplus of hydrogen is directed onto the surface of the crystalline substrate.

7. A method according to claim 6 , wherein the hydrogen surplus acts as a surfactant on the surface of the crystalline substrate.

8. A method of fabricating a vertical cavity surface emitting laser comprising the steps of:

locating a crystalline substrate in a chamber;

heating the crystalline substrate to a temperature suitable for MBE epitaxial growth;

evacuating the chamber to a pressure suitable for MBE epitaxial growth; and

injecting tertiarybutylhydrazine into the chamber and onto a surface of the crystalline substrate.

9. A method according to claim 8 , wherein a nitrogen-containing layer is formed on a surface of the crystalline substrate.

10. A method according to claim 8 , wherein a surplus of hydrogen is directed onto the surface of the crystalline substrate.

11. A method according to claim 10 , wherein the hydrogen surplus acts as a surfactant on the surface of the crystalline substrate.

12. A method according to claim 11 , wherein the injected material is a plasma having nitrogen and hydrogen.

13. A method according to claim 8 , wherein the injected material is injected from an effusion cell.

14. A method according to claim 13 , wherein the injected material forms a gaseous beam.

15. A method of fabricating a semiconductor laser, comprising the steps of:

locating a crystalline substrate in a chamber;

heating the crystalline substrate to a temperature suitable for MBE epitaxial growth;

evacuating the chamber to a pressure suitable for MBE epitaxial growth;

growing at least one semiconductor layer on the crystalline substrate; and

injecting tertiarybutylhydrazine into the chamber and onto a surface of the crystalline substrate.

16. A method according to claim 15 , wherein injecting a material forms a nitrogen-containing layer on the crystalline substrate.

17. A method according to claim 16 , wherein the injected material is injected from an effusion cell.

18. A method according to claim 15 , wherein the injecting the material forms a gaseous beam.

19. A method according to claim 15 , further including completing the fabrication of a semiconductor laser.

Assignments (7)
PATENT RELEASE AND REASSIGNMENT Recorded Jul 5, 2022
From: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
To: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
Reel/Frame 060574/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: FINISAR CORPORATION
To: II-VI DELAWARE, INC.
Reel/Frame 052286/0001 →
NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS Recorded Sep 25, 2019
From: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 050484/0204 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 2, 2004
From: HONEYWELL INTERNATIONAL, INC.
To: FINISAR CORPORATION
Reel/Frame 014499/0365 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2004
From: HONEYWELL INTERNATIONAL, INC.
To: FINISAR CORPORATION
Reel/Frame 014468/0407 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2004
From: HONEYWELL INTERNATIONAL, INC.
To: FINISAR CORPORATION
Reel/Frame 014468/0371 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 4, 2002
From: JOHNSON, RALPH H.; KIM, JIN K.; GUENTER, JAMES K.
To: HONEYWELL INTERNATIONAL INC.
Reel/Frame 013263/0258 →