Method for ascertaining position values, and scanning microscope
View Patent ↗A scanning microscope is disclosed. The scanning microscope comprises a light source which emits an illuminating light beam for illumination of a specimen, a resonant beam deflection device, for guiding the illuminating light beam over the specimen, which has a resonant frequency and a resonant frequency range, and an independent oscillator with which a drive oscillation, which has a drive frequency within the resonant frequency range can be generated which drives the beam deflection device. Furthermore a method is disclosed for controlling a scanning microscope having a resonant beam deflection.
1. A method for controlling a scanning microscope comprising the following steps:
generating, with an independent oscillator, an electrical drive oscillation that has a drive frequency, the drive frequency lying within the resonant frequency range;
transferring the drive oscillation to a resonant beam deflection device that has a resonant frequency and a resonant frequency range;
guiding an illuminating light beam line by line over a specimen using the beam deflection device; and
detecting detected light proceeding from the specimen at a frequency derived from an oscillation frequency of the independent oscillator.
2. The method as defined in claim 1 , wherein the electrical drive oscillation is generated from a basic oscillation that has a basic frequency, the basic frequency being a first integral multiple of the drive frequency.
3. The method as defined in claim 2 , wherein the basic oscillation is a square-wave oscillation.
4. The method as defined in claim 2 , wherein fluctuations in the resonant frequency are compensated for by adapting the first integral multiple.
5. The method as defined in claim 1 , wherein the drive oscillation is a sine oscillation.
6. The method as defined in claim 1 , wherein the independent oscillator contains a digital-analog converter and counters.
7. The method as defined in claim 1 , further comprising the step of:
generating from the basic oscillation a pixel clock rate which has a pixel frequency, the basic frequency being a second integral multiple of the pixel frequency.
8. The method as defined in claim 1 , wherein the drive oscillation has an amplitude, and fluctuations in the resonant frequency are compensated for by controlling the amplitude.
9. A scanning microscope comprising:
a light source which emits an illuminating light beam for illumination of a specimen,
a resonant beam deflection device, for guiding the illuminating light beam over the specimen, which has a resonant frequency and a resonant frequency range,
an independent oscillator with which a drive oscillation, which has a drive frequency within the resonant frequency range can be generated which drives the beam deflection device, and
a detector for detecting detected light proceeding from the specimen at a frequency derived from an oscillation frequency of the independent oscillator.
10. The scanning microscope as defined in claim 9 , wherein the electrical drive oscillation in the oscillator can be generated from a basic oscillation which has a basic frequency, the basic frequency being a first integral multiple of the drive frequency.
11. The scanning microscope as defined in claim 10 , wherein the basic oscillation is a square-wave oscillation.
12. The scanning microscope as defined in claim 10 , wherein the oscillator contains a ring counter with which the basic oscillation can be generated.
13. The scanning microscope as defined in claim 10 further comprising means for varying the first integral multiple.
14. The scanning microscope as defined in claim 13 , wherein fluctuations in the resonant frequency can be compensated for by adapting the first integral multiple.
15. The scanning microscope as defined in claim 9 , wherein the basic oscillation is a sine oscillation.
16. The scanning microscope as defined in claim 9 , wherein the oscillator contains at least one digital-analog converter and counters.
17. The scanning microscope as defined in claim 9 , wherein the oscillator generates from the basic oscillation a pixel clock rate which has a pixel frequency, the basic frequency being a second integral multiple of the pixel frequency.
18. The scanning microscope as defined in claim 17 , further comprising a detector for detecting detected light proceeding from the specimen at the pixel clock rate.
19. The scanning microscope as defined in claim 9 , wherein the illuminating light beam can be guided line by line over the specimen.
20. The scanning microscope as defined in claim 9 , further comprising a means for varying an amplitude of the drive oscillation.
21. The scanning microscope as defined in claim 20 , wherein fluctuations in the resonant frequency can be compensated for by controlling the amplitude in open- or closed-loop fashion.
22. A confocal scanning microscope comprising:
a light source which emits an illuminating light beam for illumination of a specimen,
a resonant beam deflection device, for guiding the illuminating light beam over the specimen, which has a resonant frequency and a resonant frequency range,
an independent oscillator with which a drive oscillation, which has a drive frequency within the resonant frequency range can be generated which drives the beam deflection device, and
a detector for detecting detected light proceeding from the specimen at a frequency derived from an oscillation frequency of the independent oscillator.
23. The scanning microscope as defined in claim 22 , wherein the electrical drive oscillation in the oscillator can be generated from a basic oscillation which has a basic frequency, the basic frequency being a first integral multiple of the drive frequency.