IP Library Granted Patent US 7,171,130
Granted Patent B2
US 7,171,130 · App. 10/242,589 · Granted Jan 30, 2007

Optical performance monitor utilizing nonlinear detection

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Quick Facts
Patent No.
US 7,171,130
App. No.
10/242,589
Granted
Jan 30, 2007
Kind
B2
Abstract

An optical performance monitor particularly well-suited for use in dense wavelength-division multiplexed (DWDM) systems includes both a nonlinear optical detector and a conventional linear detector. The nonlinear optical detector, which may comprise a quadratic detector, is used to provide information, on a channel-by-channel basis, regarding chromatic dispersion, polarization mode dispersion and accumulated amplified spontaneous emission (ASE) noise in each signal wavelength.

Claims (30)

1. An optical performance monitor for measuring the operating characteristics of an optical transmission signal, the optical performance monitor comprising

a linear optical detector responsive to the optical transmission signal for measuring the power of said optical transmission signal; and

a nonlinear optical detector responsive to said optical transmission signal for generating a substantially quadratic, nonlinear output signal S NL determining signal distortions associated with: (1) chromatic dispersion, using the relation:

S NL =ηT 2 P ave 2 ·1/τ,

where η is a proportionality constant associated with the nonlinear detector, T is defined as the bit period of the optical transmission signal, τ is defined as the pulse duration of the optical transmission signal, and P ave is the average pulse power, the value of τ being an indicator of the presence of chromatic dispersion; (2) polarization mode dispersion, using the relation:

S NL =ηT 2 P ave 2 ·1 /τ[x 2 +(1 −x ) 2 ],

where “x” is defined as the fractional amplitude of a first polarization state and (1−x) is defined as the fraction amplitude of a second, orthogonal polarization state; and (3) accumulated amplified spontaneous emission of said optical transmission signal using the relation:

S NL =ηP ave 2 T[x 2 +( T /τ)(1 −x ) 2 ],

where the term T/τ is indicative of the amount of accumulated amplified spontaneous emission.

2. An optical performance monitor as defined in claim 1 wherein the nonlinear optical detector comprises a silicon avalanche photodiode.

3. An optical performance monitor as defined in claim 2 wherein the silicon avalanche photodiode generates an output signal S NL is proportional to the input power of the optical transmission signal raised to a value of 1.7.

4. An optical performance monitor as defined in claim 1 for use in a wavelength division multiplexed transmission system that utilizes a plurality of optical signals propagating at separate wavelengths, the monitor further comprising

a wavelength-selective device for filtering out a particular wavelength signal to be applied as the input to the linear detector and the nonlinear detector.

5. An optical performance monitor as defined in claim 4 wherein the wavelength-selective device is tunable so as to select, as a function of time, a particular wavelength to be applied as an input to the linear detector and the nonlinear detector.

6. An optical performance monitor as defined in claim 4 wherein the wavelength-selective device comprises a Fabry-Perot filter.

7. An optical performance monitor as defined in claim 4 wherein the wavelength-selective device comprises a diffraction grating.

8. An optical performance monitor for use in a dense wavelength division multiplexed (DWDM) optical transmission system supporting a plurality of optical signals propagating at a plurality of separate wavelengths along a single transmission line, the monitor comprising

a tapping element for removing a portion of the optical signal propagating along the single transmission line;

a wavelength-selective device for filtering and providing as an output an optical signal propagating at a selected wavelength from the plurality of separate wavelengths;

a linear optical detector responsive to the selected wavelength output from the wavelength-selective device for measuring the power of said selected wavelength optical signal; and

a nonlinear optical detector responsive to the selected wave length output from the wavelength-selective device for producing as an output a substantially Quadratic. nonlinear signal S NL indicative of:(1) chromatic dispersion, using the relation:

S NL =ηT 2 P ave 2 ·1/τ,

where η is a proportionality constant associated with the nonlinear detector, T is defined as the bit period of the optical transmission signal, τ is defined as the pulse duration of the optical transmission signal, and P ave is the average pulse power, the value of τ being an indicator of the presence of chromatic dispersion: 2 polarization mode dispersion, using the relation:

S NL =ηT 2 P ave 2 ·1 /τ [x 2 +(1) 2 ],

where “x” is defined as the fractional amplitude of a first polarization state and (1−x) is defined as the fraction amplitude of a second, orthogonal polarization state; and (3) accumulated amplified spontaneous emission noise present in the selected optical signal using the relation:

S NL =ηP ave 2 T[x 2 +( T /τ)(1 −x ) 2 ],

where the term T/τ is indicative of the amount of accumulated am amplified spontaneous emission.

9. An optical performance monitor as defined in claim 8 wherein the nonlinear detector comprises a silicon avalanche photodiode.

10. An optical performance monitor as defined in claim 8 wherein the wavelength-selective device comprises a tunable Fabry-Perot filter.

11. An optical performance monitor as defined in claim 8 wherein the wavelength-selective device comprises a tunable diffraction grating.

Assignments (1)
CHANGE OF NAME Recorded Dec 21, 2010
From: FITEL USA CORP.
To: FURUKAWA ELECTRIC NORTH AMERICA, INC.
Reel/Frame 025521/0684 →