IP Library Granted Patent US 6,987,311
Granted Patent B2
US 6,987,311 · App. 10/250,017 · Granted Jan 17, 2006

Thin film transistors of a thin film transistor liquid crystal display and method for fabricating the same

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Quick Facts
Patent No.
US 6,987,311
App. No.
10/250,017
Granted
Jan 17, 2006
Kind
B2
Abstract

A method for fabricating thin film transistors (TFT) of a TFT-LCD. The method first forms a gate electrode of the TFT in a transistor area of a substrate. Then a first dielectric layer, a light shielding layer, a second dielectric layer, a semiconductor layer, a doped silicon conductive layer and a second metal layer are sequentially formed on the gate electrode so as to form the TFT in the transistor area. A channel area is defined in the TFT for separating the second metal layer and the doped silicon conductive layer so as to respectively form a source electrode and a drain electrode of the TFT. Finally, a passivation layer and a transparent conductive layer are sequentially formed on the drain electrode, and the transparent conductive layer is connected with the drain electrode through a first via hole of the passivation layer.

Claims (31)

1. A thin film transistor liquid crystal display (TFT-LCD), the TFT-LCD comprising:

at least one thin film transistor, the thin film transistor comprising:

a first metal layer of a first pattern being formed in a transistor area on a surface of a substrate;

a gate insulating layer of a first pattern, a light shielding layer of a first pattern, a semiconductor layer of a first patter, a doped silicon layer of a first pattern and a second metal layer of a first pattern being sequentially stacked on the first metal layer of the first pattern;

a channel area separating both the second metal layer of the first pattern and the doped silicon layer of the first pattern into two sides respectively used as a source electrode and a drain electrode;

a passivation layer of a first pattern covering both the second metal layer of the first pattern and the channel area, and a first contact hole being formed in the passivation layer of the first pattern; and

a transparent conductive layer of a first pattern covering the passivation of the first pattern positioned above the drain electrode, and the transparent conductive layer of the first pattern being electrically connected with the drain electrode through the first contact hole;

at least one capacitor, the capacitor comprising:

a first metal layer of a second pattern being formed in a capacitor area on the surface of the substrate;

a gate insulating layer of a second pattern, a light shielding layer of a second pattern, a semiconductor layer of a second pattern, a doped silicon layer of a second pattern and a second metal layer of a second pattern being sequentially stacked on the first metal layer of the second pattern;

a passivation layer of a second pattern covering the second metal layer of the second pattern, and a second contact bole being formed in the passivation layer of the second pattern; and

a transparent conductive layer of a second pattern covering the passivation layer of the second pattern, and the transparent conductive layer of the second pattern being electrically connected with the second metal layer of the second pattern through the second contact hole;

at least one conductive line, the conductive line comprising:

a gate insulating layer of a third pattern, a light shielding layer of a third pattern, a semiconductor layer of a third pattern, a doped silicon layer of a third pattern and a second metal layer of a third pattern being sequentially stacked on the surface of the substrate in a conductive line area;

a passivation layer of a third pattern covering the second metal layer of the third pattern, and a third contact hole being formed in the passivation layer of the third pattern; and

a transparent conductive layer of a third pattern covering the passivation layer of a third pattern, and the transparent conductive layer of the third pattern being electrically connected with the second metal layer of the third pattern through the third contact hole.

2. The TFT-LCD of claim 1 wherein the first metal layer of a first pattern is used as a gate electrode of the thin film transistor.

3. The TFT-LCD of claim 1 wherein each of the light shielding layers comprises a light absorbing insulating layer.

4. The TFT-LCD of claim 1 wherein each of the light shielding layers comprises a metal layer and an insulating layer.

5. The TFT-LCD of claim 1 wherein the light shielding layer comprises an amorphous silicon layer and an insulating layer.

6. The TFT-LCD of claim 1 wherein the first metal layer of the second pattern is used as a bottom electrode of the capacitor.

7. The TFT-LCD of claim 1 wherein the second metal layer of the second pattern is used as a top electrode of the capacitor.

8. A thin film transistor comprising:

a patterned first metal layer formed in a transistor area of a substrate;

a patterned gate insulating layer, a patterned light absorbing insulating layer, a patterned semiconductor layer, a patterned doped silicon layer, and a patterned second metal layer sequentially stacked on a surface of the patterned first metal layer; and

a channel area separating the patterned second metal layer and the patterned doped silicon layer so as to respectively form a source electrode and a drain electrode.

9. The thin film transistor of claim 8 , wherein a pattern of the patterned light absorbing insulating layer is substantially the same as a pattern of the patterned semiconductor layer.

10. A thin film transistor comprising:

a patterned first metal layer formed in a transistor area of a substrate;

a patterned first insulating layer, a patterned light shielding layer, a patterned second insulating layer, a patterned semiconductor layer, a patterned doped silicon layer, and a patterned second metal layer sequentially stacked on a surface of the patterned first metal layer, a pattern of the patterned light shielding layer being substantially the same as a pattern of the patterned semiconductor layer, and the light shielding layer being formed of a metal layer; and

a channel area separating the patterned second metal layer and the patterned doped silicon layer so as to respectively form a source electrode and a drain electrode.

Assignments (2)
CHANGE OF NAME Recorded Apr 3, 2014
From: CHIMEI INNOLUX CORPORATION
To: INNOLUX CORPORATION
Reel/Frame 032604/0487 →
MERGER Recorded May 10, 2010
From: CHI MEI OPTOELECTRONICS CORP.
To: CHIMEI INNOLUX CORPORATION
Reel/Frame 024358/0143 →