IP Library Granted Patent US 6,898,004
Granted Patent B2
US 6,898,004 · App. 10/252,434 · Granted May 24, 2005

Microscope system

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Quick Facts
Patent No.
US 6,898,004
App. No.
10/252,434
Granted
May 24, 2005
Kind
B2
Abstract

In a microscope system, illumination light rays are emitted from a light source. The illumination light rays are collimated and reflected from a mirror to the optical element array. The optical element array is located at a conjugate position of a specimen, and includes a plurality of micro mirrors arranged in a matrix form. The micro mirrors are individually controlled to selectively reflect the illumination light rays for illuminating the specimen. Thus, a predetermined pattern of the light rays is reflected from the optical element array to an objective lens. The illumination light rays are projected on the specimen from the objective lens and the specimen is illuminated by the predetermined illumination pattern.

Claims (12)

1. A microscope system for observing a specimen, comprising:

an objective lens facing the specimen;

an illuminating unit configured to emit illumination light rays;

a first optical element array including a plurality of first micro deflection elements, each configured to deflect the illumination light rays emitted from the illumination unit and to selectively direct the illumination light rays in one of first and second directions, the optical element array being located at a first conjugate position with respect to the specimen;

a second optical element array including a plurality of second micro deflection elements, each configured to deflect the illumination light rays emitted from the illumination unit and to selectively direct the illumination light rays to the first optical element array, the second optical element array being located at one of an aperture stop position and a second conjugate position with respect to the aperture stop position;

a control section configured to control the first and second micro deflection elements, individually, to form a pattern of the illumination light rays directed to the first direction; and

a transfer optical system configured to transfer the pattern of the illumination liqht rays to the specimen through the lens.

2. The microscope system according to claim 1 , wherein the first and second micro deflection elements of he first and second optical element arrays comprise respective reflecting surfaces, and each reflecting surface is tilted and selectively reflects the illumination light rays in the one of the first and second directions.

3. The microscope system according to claim 1 , further comprising:

a collection lens which is arranged between the illumination unit and the second optical element array, and which is configured to collimate the illumination light rays emitted from the illumination unit and to project the collimated light rays on the second optical element array.

4. The microscope system according to claim 1 , further comprising:

a mirror which is arranged in an optical path between the specimen and the first optical element array, and which is configured to reflect the light rays from the first optical element array to the specimen.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 8, 2022
From: OLYMPUS CORPORATION
To: EVIDENT CORPORATION
Reel/Frame 060741/0576 →
CHANGE OF ADDRESS Recorded Jun 27, 2016
From: OLYMPUS CORPORATION
To: OLYMPUS CORPORATION
Reel/Frame 039344/0502 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2002
From: SHIMIZU, KEIJI; MISHIMA, SHUZO; KAWANO, YOSHIHIRO
To: OLYMPUS OPTICAL CO., LTD.
Reel/Frame 013500/0945 →