IP Library Granted Patent US 6,885,024
Granted Patent B2
US 6,885,024 · App. 10/256,885 · Granted Apr 26, 2005

Devices with organic crystallite active channels

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Quick Facts
Patent No.
US 6,885,024
App. No.
10/256,885
Granted
Apr 26, 2005
Kind
B2
Abstract

A method fabricates ICs in which organic semiconductor crystallites serve as active channels of semiconductor devices. The method includes providing a substrate with a surface that has a preselected pattern of adhesion sites located thereon. The adhesion sites are prepared to adhere crystallites of an organic semiconductor. The method also includes applying a plurality of crystallites of the organic semiconductor to the surface to enable a portion of the applied crystallites to adhere at the prepared adhesion sites.

Claims (37)

1. A method, comprising:

providing a substrate whose surface has a preselected pattern of adhesion sites located thereon, the adhesion sites being prepared to adhere crystallites of an organic semiconductor; and

applying a plurality of crystallites of the organic semiconductor to the surface to enable a portion of the applied crystallites to adhere to at least a portion of the prepared adhesion sites.

2. The method of claim 1 , wherein portions of the surface between the adhesion sites are functionalized with functional groups that do not adhere the crystallites of the organic semiconductor.

3. The method of claim 2 , wherein the portions are functionalized with fluorinated functional groups.

4. The method of claim 1 , wherein surfaces of the adhesion sites are functionalized with functional groups that adhere the crystallites of the organic semiconductor.

5. The method of claim 4 , wherein surfaces of the crystallites of the organic semiconductor are functionalized with functional groups that bind to the adhesion sites.

6. The method of claim 5 , wherein the surfaces of the adhesion sites and crystallites are one of both functionalized with aromatic groups and both functionalized with hydrophilic groups.

7. The method of claim 1 , wherein the providing includes electrically charging the adhesion sites to attract a portion of charged ones of the crystallites.

8. The method of claim 1 , wherein a portion of the adhesion sites have gate electrodes associated with the adhesion sites.

9. The method of claim 8 , wherein the providing further comprises charging the gate electrodes to enable the associated adhesion sites to bind a portion of the charged ones of the crystallites.

10. The method of claim 1 , wherein the applying comprises causing a fluid to transport the crystallites of the organic semiconductor over the surface.

11. The method of claim 1 , wherein the applying comprises causing the crystallites of the organic semiconductor to sediment through a fluid onto the surface.

12. The method of claim 1 , wherein the applying comprises:

causing the crystallites of organic semiconductor to adhere to a surface of a stamp; and

bringing the surface of the stamp in contact with the surface of the substrate.

13. The method of claim 1 , further comprising:

then, removing from the surface ones of the crystallites that are unbound at adhesion sites; and

fixing to the surface ones of the crystallites that are bound at the adhesion sites.

14. An integrated circuit, comprising:

a substrate and an array of organic field effect transistors on the substrate, each transistor comprising:

a crystallite of organic semiconductor that is located over the substrate;

a gate structure positioned to control a conductivity of a channel portion of the crystallite; and

conductive source and drain electrodes located on opposite ends of the channel portion; and

wherein the largest dimension of each crystallite is 1 millimeter or less.

15. The integrated circuit of claim 14 , wherein the gate structure includes a gate electrode that is located in the substrate.

16. An integrated circuit, comprising:

a substrate and an array of organic field effect transistors located on the substrate, each transistor comprising:

a crystallite of organic semiconductor that is located over the substrate;

a gate structure positioned to control a conductivity of a channel portion of the crystallite; and

conductive source and drain electrodes located on opposite ends of the channel portion; and

a pattern of separated adhesion sites, each adhesion site interposed between a region of the substrate and an associated one of the crystallites, the adhesion sites having a chemical composition configured to bind the crystallites to the substrate.

17. The integrated circuit of claim 14 , wherein different ones of the transistors have channels that are physically isolated from each other.

18. The integrated circuit of claim 14 , wherein the conductive source and drain electrodes are located on the substrate.

19. The integrated circuit of claim 14 , wherein the crystallite of each transistor is physically isolated from the crystallites of the remaining one or more transistors.

20. The integrated circuit of claim 19 , wherein the crystallites have largest dimensions of 100 microns or less.

21. The integrated circuit of claim 16 , wherein the largest dimension of each crystallite is 1 millimeter or less.

Assignments (11)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2021
From: PROVENANCE ASSET GROUP LLC
To: RPX CORPORATION
Reel/Frame 059352/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 30, 2021
From: CORTLAND CAPITAL MARKETS SERVICES LLC
To: PROVENANCE ASSET GROUP HOLDINGS LLC; PROVENANCE ASSET GROUP LLC
Reel/Frame 058983/0104 →
RELEASE OF SECURITY INTEREST Recorded Nov 30, 2021
From: NOKIA US HOLDINGS INC.
To: PROVENANCE ASSET GROUP HOLDINGS LLC; PROVENANCE ASSET GROUP LLC
Reel/Frame 058363/0723 →
ASSIGNMENT AND ASSUMPTION AGREEMENT Recorded Feb 14, 2019
From: NOKIA USA INC.
To: NOKIA US HOLDINGS INC.
Reel/Frame 048370/0682 →
SECURITY INTEREST Recorded Sep 13, 2017
From: PROVENANCE ASSET GROUP HOLDINGS, LLC; PROVENANCE ASSET GROUP LLC
To: NOKIA USA INC.
Reel/Frame 043879/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2017
From: NOKIA TECHNOLOGIES OY; NOKIA SOLUTIONS AND NETWORKS BV; ALCATEL LUCENT SAS
To: PROVENANCE ASSET GROUP LLC
Reel/Frame 043877/0001 →
SECURITY INTEREST Recorded Sep 13, 2017
From: PROVENANCE ASSET GROUP HOLDINGS, LLC; PROVENANCE ASSET GROUP, LLC
To: CORTLAND CAPITAL MARKET SERVICES, LLC
Reel/Frame 043967/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2014
From: CREDIT SUISSE AG
To: ALCATEL-LUCENT USA INC.
Reel/Frame 033949/0531 →
MERGER Recorded May 12, 2014
From: LUCENT TECHNOLOGIES INC.
To: ALCATEL-LUCENT USA INC.
Reel/Frame 032874/0823 →
SECURITY INTEREST Recorded Mar 7, 2013
From: ALCATEL-LUCENT USA INC.
To: CREDIT SUISSE AG
Reel/Frame 030510/0627 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 27, 2002
From: BAO, ZHENAN; KATZ, HOWARD EDAN; KLOC, CHRISTIAN
To: LUCENT TECHNOLOGIES INC.
Reel/Frame 013351/0465 →