Partially mirrored beam tap for wavelength lockers
View Patent ↗A partially mirrored beam tap for use in wavelength and power monitoring, wherein the partially mirrored beam tap splits off at least two beams from an elliptical Gaussian output beam, wherein a first split-off beam is transmitted to an etalon and one or more first photo-detectors for wavelength monitoring, while a second split-off beam is transmitted to one or more second photo-detectors as a reference and for power monitoring. The partially mirrored beam tap splits off the first and second split-off beams from upper and lower tails of the output beam, wherein upper and lower portions of the partially mirrored beam tap comprise mirrored surfaces that reflect tails of the output beam and a center portion of the partially mirrored beam tap comprises a clear rectangular aperture that passes the output beam.
1. A wavelength locker for use in monitoring a wavelength and power of an output beam from a laser, comprising:
a planar partially mirrored beam tap for splitting off at least first and second beams from tails of an elliptical output beam,
wherein upper and lower portions of the partially mirrored beam tap comprise mirrored surfaces that reflect the tails of the output beam, and a center portion of the partially mirrored beam tap comprises a clear aperture that passes a remainder of the output beam,
wherein the first split-off beam is transmitted to an etalon and one or more first photo-detectors for wavelength monitoring, while the second split-off beam is transmitted to one or more second photo-detectors as a reference and for power monitoring, and
wherein the first and second photo-detectors are configured to detect beam movement.
2. The wavelength locker of claim 1 , wherein the first and second photo-detectors are configured as dual photo-detectors that can detect beam movement in one axis.
3. The wavelength locker of claim 1 , wherein the first and second photo-detectors are each configured as quad photo-detectors that can detect beam movement in two axes.
4. A method of monitoring a wavelength and power of an output beam from a laser using a wavelength locker, comprising:
splitting off at least first and second beams from tails of an elliptical output beam using a planar partially mirrored beam tap,
wherein upper and lower portions of the partially mirrored beam tap comprise mirrored surfaces that reflect the tails of the output beam, and a center portion of the partially mirrored beam tap comprises a clear aperture that passes a remainder of the output beam,
wherein the first split-off beam is transmitted to an etalon and one or more first photo-detectors for wavelength monitoring, while the second split-off beam is transmitted to one or more second photo-detectors as a reference and for power monitoring, and
wherein the first and second photo-detectors are configured to detect beam movement.
5. The method of claim 4 , wherein the first and second photo-detectors are configured as dual photo-detectors that can detect beam movement in one axis.
6. The method of claim 4 , wherein the first and second photo-detectors are each configured as quad photo-detectors that can detect beam movement in two axes.
7. An optoelectronic device, comprising: a laser for generating an output beam; and
a wavelength locker for use in monitoring a wavelength and power of an output beam from a laser, the wavelength locker including a planar partially mirrored beam tap for splitting off at least first and second beams from tails of an elliptical output beam,
wherein upper and lower portions of the partially mirrored beam tap comprise mirrored surfaces that reflect the tails of the output beam, and a center portion of the partially mirrored beam tap comprises a clear aperture that passes a remainder of the output beam,
wherein the first split-off beam is transmitted to an etalon and one or more first photo-detectors for wavelength monitoring, while the second split-off beam is transmitted to one or more second photo-detectors as a reference and for power monitoring, and
wherein the first and second photo-detectors are configured to detect beam movement.
8. The optoelectronic device of claim 7 , wherein the first and second photo-detectors are configured as dual photo-detectors that can detect beam movement in one axis.
9. The optoelectronic device of claim 7 , wherein the first and second photo-detectors are each configured as quad photo-detectors that can detect beam movement in two axes.