IP Library › Patent Application 10284784
Patent Application Utility
App. No. 10/284,784 · Confirmation No. 2381

CHEMICALLY ENHANCED FOCUSED ION BEAM MICRO-MACHINING OF COPPER

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
⬇ PDF
 Code Description Pages PDF
2003-08-15 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-08-15 LET. Miscellaneous Incoming Letter 1 View
2002-10-31 TRNA Transmittal of New Application 2 View
2002-10-31 A.PE Preliminary Amendment 4 View
2002-10-31 SPEC Specification 11 View
2002-10-31 CLM Claims 9 View
2002-10-31 ABST Abstract 1 View
2002-10-31 DRW Drawings-only black and white line drawings 4 View
2002-10-31 OATH Oath or Declaration filed 5 View
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
App. No.
10/284,784
Filed
2002-10-31
Granted
2003-11-11
Pub. No.
US20030060048A1
Art Unit
1765
PTA
-89 days