Scanning microscope, method for scanning microscopy, and bandpass filter
View Patent ↗A scanning microscope with a light source for illumination of a specimen, a means for spatial spectral division of the detection light, and a detector is disclosed. The scanning microscope has means for selecting a lower limit wavelength that defines a lower exclusion region, and means for selecting an upper limit wavelength that defines an upper exclusion region, as well as a first and a second adjustable stop that block light components of the lower and the upper exclusion region of the detection light. A bandpass filter and a method for scanning microscopy are also disclosed.
1. A scanning microscope comprising:
a light source for illumination of a specimen,
a means for spatial spectral division of detection light,
a focusing means for focusing the detection light,
a first adjustable stop that blocks only light components having a wavelength below an upper limit of a lower exclusion region and is disposed in a focal plane of the focusing means,
a second adjustable stop that blocks only light components having a wavelength above a lower limit of an upper exclusion region and is disposed in the focal plane of the focusing means, and
a detector receiving unblocked components of the detection light.
2. The scanning microscope as defined in claim 1 , wherein the first and the second stop are rotatable eccentrics.
3. The scanning microscope as defined in claim 2 , wherein the means for spatial spectral division of the detection light defines a division plane, and the first and the second stop are rotatable in the division plane.
4. The scanning microscope as defined in claim 2 , wherein the means for spatial spectral division of the detection light defines a division plane, and the first and the second stop are rotatable about axes parallel to the division plane.
5. The scanning microscope as defined in claim 1 , wherein the means for spatial spectral division contains a prism, a grating, or a hologram.
6. The scanning microscope as defined in claim 1 , wherein at least one drive means is provided for setting the first and the second stop.
7. The scanning microscope as defined in claim 6 , wherein the drive means contains a motor, a stepper motor, a galvanometer, a piezomotor, or a galvanometer.
8. The scanning microscope as defined in claim 6 , wherein the drive means is controlled by a PC.
9. A bandpass filter comprising:
means for spatial spectral division of light,
a focusing means for focusing the light,
a first adjustable stop that blocks only light components having a wavelength below an upper limit of a lower exclusion region and is disposed in a focal plane of the focusing means,
a second adjustable stop that blocks only light components having a wavelength above a lower limit of an upper exclusion region and is disposed in the focal plane of the focusing means.
10. The bandpass filter as defined in claim 9 , wherein the first and the second stop are rotatable eccentrics.
11. The bandpass as defined in claim 9 , wherein the means for spatial spectral division of the detection light defines a division plane, and the first and the second stop are rotatable in the division plane.
12. The bandpass as defined in claim 9 , wherein the means for spatial spectral division of the detection light defines a division plane, and the first and the second stop are rotatable about axes parallel to the division plane.
13. The bandpass filter as defined in claim 9 , wherein the bandpass filter is positionable in a beam path of a scanning microscope.
14. The bandpass filter as defined in claim 9 , wherein at least one drive means is provided for setting the first and the second stop.
15. The bandpass filter as defined in claim 14 , wherein the drive means is controlled by a PC.
16. A method for scanning microscopy, a specimen being illuminated with illuminating light of a light source and the detection light proceeding from the specimen being spatially spectrally divided, the method comprising:
focusing the detection light using a focusing means;
setting the lower exclusion region with a first adjustable stop that blocks only light components having a wavelength below an upper limit of a lower exclusion region, the first adjustable stop being disposed in a focal plane of the focusing means;
setting an upper exclusion region with a second adjustable stop that blocks only light components having a wavelength above a lower limit of the upper exclusion region, the second adjustable stop being disposed in the focal plane of the focusing means; and
detecting the unblocked light components of the detection light.
17. The method as defined in claim 16 , wherein the first and the second stop are rotatable eccentrics.
18. The method as defined in claim 16 , wherein the means for spatial spectral division of the detection light defines a division plane, and the first and the second stop are rotatable in the division plane.
19. The method as defined in claim 16 , wherein the means for spatial spectral division of the detection light defines a division plane, and the first and the second stop are rotatable about axes parallel to the division plane.