Laser scanning microscope
View Patent ↗In a laser scanning microscope comprising a deflecting device, which is provided for variable deflection of a laser beam about a deflection angle, and a control unit, which controls the deflecting device via a control signal and measures, at least temporarily, a present deflection angle value, it is envisaged that, at the time of measurement of the present deflection angle value, a testing structure, which comprises at least one structural element whose position is assigned to a predetermined deflection angle value, is arranged downstream of the deflecting device, a detecting device is provided, which emits a detection signal when the laser beam is directed to the structural element, and the control unit assigns the present control signal to the predetermined deflection angle value upon reception of the detection signal.
1. A laser scanning microscopy method, wherein
a laser beam is variably deflected about a deflection angle by controlling a deflecting device to create a variable deflection, in which the variable deflection enables an electro-optical zoom by varying a maximum deflection in which each different maximum deflection corresponds to a different zoom factor,
characterized in that
the deflection angle is measured by detecting the position of the laser beam downstream of the deflecting device, and
the deflection angle is measured for several different zoom factors.
2. The laser scanning microscopy method as claimed in claim 1 , characterized in that, for measurement of the deflection angle, a testing structure, which comprises at least one structural element, the position of said structural element being assigned to a predetermined deflection angle value, is arranged downstream of the deflecting device, and the deflection is set such that the laser beam is directed to the structural element and said deflection setting is assigned to the predetermined deflection angle value.
3. The laser scanning microscopy method as claimed in claim 2 , characterized in that the testing structure comprises a plurality of line-type structural elements, which are equidistantly spaced from each other and arranged along a deflection direction, and that said deflection is adjusted along the deflection direction such that the laser beam is successively directed to the structural elements.
4. The laser scanning microscopy method as claimed in claim 2 , characterized in that calibration of the deflecting device is effected using correlations between the deflection settings and the predetermined deflection angle values.
5. The laser scanning microscopy method as claimed in claim 3 , characterized in that deflection of the reciprocating laser beam is effected successively at different frequencies, a frequency response of the deflecting device is determined from the correlations at the various frequencies and said frequency response is accordingly used for controlling the deflecting device.
6. The laser scanning microscopy method as claimed in claim 4 , characterized in that, on the basis of said frequency response, Fourier coefficients are determined by means of Fourier analysis and the control of the deflecting device using said Fourier coefficients is effected in a reciprocating manner with a change in said deflection being uniform in time.