Electromagnetic energy probe with integral impedance matching

1. A probe for sampling electromagnetic energy in a circuit comprising:

a mating portion for temporarily mating with and sampling energy from a electromagnetic energy transmission media in the circuit; and

a correction device for correcting impedance mismatch in the electromagnetic energy transmission media resulting from mating the mating portion with the electromagnetic energy transmission media of the circuit,

wherein the mating portion includes a coupling conductor for retrieving a sample of the electromagnetic energy in the electromagnetic energy transmission media, and

the coupling conductor is configured as a coplanar coupler with respect to the electromagnetic energy transmission media.

2. The probe of claim 1 wherein the probe is configured to sample electromagnetic energy in a microwave circuit, a radio frequency circuit, or a millimeter wave circuit.

3. The probe of claim 1 wherein the electromagnetic energy transmission media is a microstrip, coplanar waveguide, or slot line.

4. The probe of claim 1 wherein the correction device includes at least one dielectric overlay that overlays the electromagnetic energy transmission media when the mating portion is mated with the electromagnetic energy transmission media.

5. The probe of claim 1 , wherein the temporary mating of the mating portion with the electromagnetic energy transmission media increases a capacitance of the circuit, thereby decreasing an impedance of the circuit, the correction device substantially negating the increase in the capacitance such that the impedance of the circuit is substantially unchanged as compared to an impedance of the circuit prior to the temporary mating of the mating portion with the electromagnetic energy transmission media.

6. A probe for sampling electromagnetic energy in a circuit comprising:

a mating portion for mating with a electromagnetic energy transmission media in the circuit, the mating portion including a coupling conductor for retrieving a sample of the electromagnetic energy in the electromagnetic energy transmission media; and

a correction device for correcting impedance mismatch resulting from mating the mating portion with the electromagnetic energy transmission media of the circuit,

wherein the coupling conductor is a quarter wavelength conductor, and the correction device includes a first quarter wavelength dielectric overlay positioned on a first side of the coupling conductor, and a second quarter wavelength dielectric overlay on a second side of the coupling conductor, the combination of the coupling conductor, the first quarter wavelength dielectric overlay, and the second quarter wavelength dielectric overlay forming a three quarter wavelength overlay that overlays the electromagnetic energy transmission media when the mating portion is mated with the electromagnetic energy transmission media.

7. A electromagnetic energy sampling circuit comprising:

an electromagnetic energy transmission media for carrying electromagnetic energy; and

a probe for sampling the electromagnetic energy in the electromagnetic energy transmission media, said probe including a mating portion for temporarily mating with and sampling energy from the electromagnetic energy transmission media, said probe also including a correction device for correcting impedance mismatch in the electromagnetic energy transmission media resulting from mating the mating portion with the electromagnetic energy transmission media,

wherein the mating portion is a quarter wavelength conductor, and the correction device includes a first quarter wavelength dielectric overlay positioned on a first side of the mating portion and a second quarter wavelength dielectric overlay positioned on a second side of the mating portion.

8. The electromagnetic energy sampling circuit of claim 7 wherein the mating portion, the first quarter wavelength dielectric overlay, and the second quarter wavelength dielectric overlay form a three quarter wavelength overlay that overlays the electromagnetic energy transmission media when the mating portion is mated with the electromagnetic energy transmission media.

9. The electromagnetic energy sampling circuit of claim 7 wherein the correction device is configured to transform an impedance resulting from mating the mating portion with the electromagnetic transmission media to another impedance substantially similar to a characteristic impedance of the electromagnetic transmission media.

10. A method of sampling a signal in a circuit, the method comprising the steps of:

temporarily mating a probe including a correction device with a electromagnetic energy transmission media in the circuit;

correcting impedance mismatch in the electromagnetic energy transmission media using the correction device, the impedance mismatch resulting from the mating of the probe with the electromagnetic energy transmission media; and

sampling a portion of the signal in the circuit with the probe by placing a coupler in a coplanar alignment with the electromagnetic energy transmission media.

11. The method of claim 10 wherein the step of mating includes:

clamping the probe to the electromagnetic energy transmission media.

12. The method of claim 10 additionally comprising the step of:

attaching the probe to equipment for analyzing the sampled portion of the signal.

13. The method of claim 10 additionally comprising the step of:

transmitting the sampled portion of the signal to another circuit.

14. A method joining a first subassembly circuit with a second subassembly circuit, the method comprising the steps of:

temporarily mating a probe including a correction device with a electromagnetic energy transmission media in the first subassembly circuit;

correcting impedance mismatch in the electromagnetic energy transmission media of the first subassembly circuit using the correction device, the impedance mismatch resulting from the mating of the probe with the electromagnetic energy transmission media;

sampling a portion of the signal in the first subassembly circuit using the probe; and

transmitting the sampled portion of the signal to the second subassembly circuit;

wherein the probe includes a quarter wavelength coupling conductor, and the correction device includes a first quarter wavelength dielectric overlay positioned on a first side of the coupling conductor, and a second quarter wavelength dielectric overlay positioned on a second side of the coupling conductor.