IP Library Granted Patent US 6,865,494
Granted Patent B2
US 6,865,494 · App. 10/323,135 · Granted Mar 8, 2005

Method and apparatus for noise tomography

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Quick Facts
Patent No.
US 6,865,494
App. No.
10/323,135
Granted
Mar 8, 2005
Kind
B2
Abstract

The subject invention pertains to an imaging technique and apparatus which can utilize an array of RF probes to measure the non-resonant thermal noise which is produced within a sample, such as a body, and produce a non-resonant thermal noise correlation. The detected noise correlation is a function of the spatial overlap of the electromagnetic fields of the probes and the spatial distribution of the conductivity of the sample. The subject technique, which can be referred to as Noise Tomography (NT), can generate a three-dimensional map of the conductivity of the sample. Since the subject invention utilizes detection of the thermal noise generated within the body, the subject method can be non-invasive and can be implemented without requiring external power, chemicals, or radionuclides to be introduced into the body. The subject imaging method can be used as a stand along technique or can be used in conjunction with other imaging techniques.

Claims (125)

1. A method of determining the conductivity of a sample as a function of position, comprising:

measuring electromagnetic fields from a sample via a plurality of probes, wherein the plurality of probes detect time-varying electromagnetic fields;

determining the measured correlation, M ij (Ω), between at least one pair of probes;

determining the conductivity of the sample as a function of position, based on the following relationship;

M

ij

(

Ω

)

=

Ω

E

i

(

σ

,

x

)

·

σ

(

x

)

·

E

j

(

σ

,

x

)

x

where σ(x) is the complex conductivity tensor of the sample as a function of position and E j (σ, x) is the electric field created in the sample at position x by probe j when driven by a unit source.

2. The method according to claim 1

wherein determining the measured correlation, M ij (Ω), between at least one pair of probes comprises determining the measured correlation, M ij (Ω), between at least one-half of the pairs of probes.

3. The method according to claim 1 ,

wherein measuring electromagnetic fields from a sample comprises measuring electromagnetic fields generated by the sample.

4. The method according to claim 3 ,

wherein the electromagnetic fields generated by the sample are generated due to the resistivity of the sample.

5. The method according to claim 3 ,

wherein the electromagnetic fields generated by the sample are dependent upon the temperature of the sample.

6. The method according to claim 1 , further comprising:

imaging the sample;

wherein determining the conductivity of the sample comprises constraining σ(x) to vary in accordance with the acquired image.

7. The method according to claim 6 ,

wherein imaging the sample comprises imaging the sample via magnetic resonance imaging.

8. The method according to claim 7 ,

wherein imaging the sample via magnetic resonance imaging is accomplished via a second plurality of probes.

9. The method according to claim 7 ,

wherein imaging the sample via magnetic resonance imaging is accomplished via the plurality of probes.

10. The method according to claim 9 ,

wherein imaging the sample via magnetic resonance imaging is accomplished at a different time from measuring electromagnetic fields from a sample.

11. The method according to claim 9 ,

wherein imaging the sample via magnetic resonance imaging is accomplished at the same time as measuring electromagnetic fields from a sample.

12. The method according to claim 1 ,

wherein at least one of the plurality of probes are rotated with respect to the sample during measuring electromagnetic fields from a sample,

wherein electromagnetic fields from the sample are measured over a first time period, the at least one of the plurality of probes are rotated with respect to the sample, and electromagnetic fields from the sample are measured over a second period of time.

13. The method according to claim 12 ,

wherein the spatial relationship between each of the plurality of probes is substantially maintained as the plurality of probes are rotated with respect to the sample.

14. The method according to claim 1 ,

wherein at least one of the plurality of probes are translated with respect to the sample during measuring electromagnetic fields from a sample,

wherein electromagnetic fields from the sample are measured over a first period of time, the at least one of plurality of probes are translated with respect to the sample, and the electromagnetic fields from the sample are measured over a second period of time.

15. The method according to claim 14 ,

wherein the spatial relationship between each of the plurality of probes is substantially maintained as the plurality of probes are translated with respect to the sample.

16. The method according to claim 1 ,

wherein measuring electromagnetic fields from a sample comprises measuring RF electromagnetic fields from the sample.

17. The method according to claim 1 ,

wherein determining the measured correlation, M ij (Ω), between at least one pair of probes comprises processing the analog signals from the i th and j th probes in real time in analog to determine M ij (Ω).

18. The method according to claim 1 ,

wherein determining the measured correlation, M ij (Ω), between at least one pair of probes comprises converting the analog signals from the i th and j th probes into corresponding digital signals and processing the digital signals from the i th and j th probes to determine M ij (Ω).

19. A method of determining the temperature of a sample as a function of position, comprising:

measuring electromagnetic fields from a sample via a plurality of probes, wherein the plurality of probes detect time-varying electromagnetic fields;

determining the measured correlation, M ij (Ω), between at least one pair of probes;

determining the temperature of the sample as a function of position, based on the following relationship;

M

ij

(

Ω

)

=

Ω

E

i

(

σ

,

x

)

·

T

(

x

)

·

E

j

(

σ

,

x

)

x

where T(x) is the temperature of the sample as a function of position and E j (σ, x) is the electric field created in the sample at position x by probe j when driven by a unit source.

Assignments (4)
ASSIGNMENT AND ASSUMPTION AGREEMENT Recorded Jun 9, 2005
From: MRI DEVICES CORPORATION
To: INVIVO CORPORATION
Reel/Frame 016309/0784 →
MERGER/CHANGE OF NAME Recorded Jan 5, 2005
From: MRI DEVICES CORPORATION
To: MRI DEVICES CORPORATION
Reel/Frame 015530/0926 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 3, 2003
From: DUENSING, G. RANDY; SAYLOR, CHARLES; HUANG, FENG
To: MRI DEVICES CORPORATION
Reel/Frame 013775/0520 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2003
From: DUENSING, G. RANDY; SAYLOR, CHARLES; HUANG, FENG
To: MRI DEVICES CORPORATION
Reel/Frame 014200/0872 →