Time-of-flight mass analyzer with multiple flight paths
View Patent ↗A TOF mass analyzer having multiple flight paths is described. The TOF mass analyzer includes a pulsed ion source that generates a packet of ions and that accelerates the packet of ions. An ion deflector directs a first group of ions from the packet of ions to a first ion path, and a second group of ions to a second ion path for each of a first and second predetermined time interval after the pulsed ion source generates the packet of ions. A first TOF mass separator separates the first group of ions according to their mass to-charge ratio and a first detector is positioned to receive the first group of ions A second TOF mass separator separates a second group of ions according to their mass to-charge ratio and a second detector is positioned to receive the second group of ions. Additional ion paths may be employed, and any type of TOF mass separator may be used in each ion path.
1. A TOF mass analyzer having multiple flight paths, the TOF mass analyzer comprising:
a) a pulsed ion source that generates a packet of ions and that accelerates the packet of ions;
b) an ion deflector that receives the packet of ions and directs a first group of ions from the packet of ions to a first ion path for a first predetermined time interval after the pulsed ion source generates the packet of ions and that directs a second group of ions from the packet of ions to a second ion path for a second predetermined time interval after the pulsed ion source generates the packet of ions;
c) a first TOF mass separator positioned to receive the first group of ions propagating along the first ion path, the first TOF mass separator separating the first group of ions according to their mass to-charge ratio;
d) a first detector positioned to receive the first group of ions that are propagating along the first ion path after being separated by the first TOF mass separator;
e) a second TOF mass separator positioned to receive the second group of ions propagating along the second ion path, the second TOF mass separator separating a second group of ions according to their according to their mass to-charge ratio; and
f) a second detector positioned to receive the second group of ions that are propagating along the second ion path after being separated by the second TOF mass separator.
2. The TOF mass analyzer of claim 1 wherein the pulsed ion source comprises a laser desorption/ionization ion source.
3. The TOF mass analyzer of claim 1 wherein the pulsed ion source comprises a delayed extraction ion source.
4. The TOF mass analyzer of claim 1 wherein the pulsed ion source comprises an injector that injects ions into a first field-free region and a pulsed ion accelerator that extracts the ions in a direction that is orthogonal to a direction of injection.
5. The TOF mass analyzer of claim 1 wherein at least one of the first and the second TOF mass separators comprises a field-free drift region.
6. The TOF mass analyzer of claim 1 further comprising a mass separator between the pulsed ion source and the ion deflector.
7. The TOF mass analyzer of claim 6 wherein the mass separator comprises a field free region.
8. The TOF mass analyzer of claim 1 wherein at least one of the first and the second TOF mass separators comprises an ion fragmentor that fragments a portion of the ions propagating in the at least one of the first and the second TOF mass separators.
9. The TOF mass analyzer of claim 1 wherein at least one of the first and the second TOF mass separators comprises a timed ion selector.
10. The TOF mass analyzer of claim 1 further comprising an ion reflector that is positioned to receive the first group of ions.
11. The TOF mass analyzer of claim 1 further comprising an ion reflector that is positioned to receive the second group of ions.
12. The TOF mass analyzer of claim 1 further comprising a first and a second data analyzer that are electrically connected to the first and the second detectors, respectively.
13. The TOF mass analyzer of claim 1 further comprising a data analyzer that is electrically connected to both the first and the second detectors.
14. The TOF mass analyzer of claim 12 wherein the data analyzer is a digitizer receiving an electrical signal generated either by a single pulse or from multiple pulses of the same sample that are summed to produce an average mass spectrum.
15. The TOF mass analyzer of claim 13 wherein the data analyzer is a digitizer receiving an electrical signal generated either by a single pulse or from multiple pulses of the same sample that are summed to produce an average mass spectrum.
16. The TOF mass analyzer of claim 1 further comprising a processor that instructs the ion deflector to direct the first group of ions to propagate along the first ion path for a first predetermined time interval after the pulsed ion source generates the packet of ions and a second group of ions to propagate along the second ion path for a second predetermined time interval after the pulsed ion source generates the packet of ions.
17. The TOF mass analyzer of claim 1 further comprising a processor that instructs a data analyzer to record electrical signals generated by at least one of the first and the second detectors, the processor determining a mass-to-charge ratio of ions generated by the pulse ion source.
18. A method for TOF mass spectrometry, the method comprising:
a) generating and accelerating a packet of ions from a sample of interest;
b) deflecting a first group of ions from the packet of ions to a first ion path at a first predetermined time after generating the packet of ions;
c) separating the first group of ions according the their mass-to-charge ratios;
d) detecting the first group of ions;
e) deflecting a second group of ions from the packet of ions to a second ion path at a second predetermined time after generating the packet of ions;
f) separating the second group of ions according to their mass-to-charge ratios; and
g) detecting the second group of ions.
19. The method of claim 18 wherein the time range for detecting the first group of ions does not overlap with the time range for detecting the second group of ions.
20. The method of claim 18 wherein detecting the first group of ions comprises digitizing data corresponding to the first group of ions.
21. The method of claim 18 wherein detecting the second group of ions comprises digitizing data corresponding to the second group of ions.
22. The method of claim 18 wherein the first group of ions comprises relatively low mass ions and the second group of ions comprises relatively high mass ions.
23. The method of claim 18 wherein generating the packet of ions comprises performing laser desorption/ionization.
24. The method of claim 18 wherein generating and accelerating the packet of ions comprises injecting ions into a field-free region and accelerating the ions in a direction that is orthogonal to a direction of injection.
25. The method of claim 18 wherein separating the first group of ions comprises drifting the first group of ions through a field-free drift space.
26. The method of claim 18 wherein separating the second group of ions comprises drifting the second group of ions through a field-free drift space.
27. The method of claim 18 including the step of fragmenting the first group of ions.
28. The method of claim 18 including the step of fragmenting the second group of ions.
29. The method of claim 18 wherein separating the first group of ions comprises selecting ions within a predetermined time interval.
30. The method of claim 18 wherein separating the second group of ions comprises selecting ions within a predetermined time interval.
31. The method of claim 18 wherein the packet of ions comprises a single pulse of ions.
32. The method of claim 20 wherein digitizing data comprises receiving an electrical signal generated by either a single pulse or from multiple pulses of the same sample that are summed to produce an average mass spectrum.
33. The method of claim 21 wherein digitizing data comprises receiving an electrical signal generated by either a single pulse or from multiple pulses of the same sample that are summed to produce an average mass spectrum.
34. A TOF mass analyzer having multiple flight paths, the TOF mass analyzercomprising:
a) a pulsed ion source that generates a packet of ions and that accelerates the packet of ions;
b) an ion deflector that receives the packet of ions and directs a first group of ions from the packet of ions to a first ion path for a first predetermined time interval after the pulsed ion source generates the packet of ions, that directs a second group of ions from the packet of ions to a second ion path for a second predetermined time interval after the pulsed ion source generates the packet of ions, and that directs a third group of ions from the packet of ions to a third ion path for a second predetermined time interval after the pulsed ion source generates the packet ofions;
c) a first TOF mass separator positioned to receive the first group of ionspropagating along the first ion path, the first TOF mass separator separating the first group of ions according to their mass to-charge ratios;
d) a first detector positioned to receive the first group of ions that are propagating along the first ion path after being separated by the first TOF mass separator;
e) a second TOF mass separator positioned to receive the second group of ions propagating along the second ion path, the second TOF mass separator separating a second group of ions according to their according to their mass to-charge ratios;
f) a second detector positioned to receive the second group of ions that are propagating along the second ion path after being separated by the second TOF mass separator; and
g) a third TOF mass separator positioned to receive the third group of ionspropagating along the third ion path, the third TOF mass separator separating a third group of ions according to their according to their mass to-charge ratios.
35. The TOF mass analyzer of claim 34 further comprising a third detector positioned to receive the third group of ions that are propagating along the third ion path.
36. A TOF mass spectrometer comprising:
a) means for generating and accelerating a packet of ions;
b) means for directing a first group of ions from the packet of ions to a first ion path for a first predetermined time interval after generating the packet of ions;
c) means for separating the first group of ions;
d) means for detecting the first group of ions after being separated by the first separating means;
e) means for directing a second group of ions from the packet of ions to a second ion path for a second predetermined time after generating the packet of ions;
f) means for separating the second group of ions; and
g) means for detecting the second group of ions after being separated by the second separating means.