Method and apparatus for the characterization of optical pulses and modulators
View Patent ↗A method and apparatus for the characterization of optical pulses and modulators includes modulating, using a modulator, a train of optical pulses, measuring a spectrum of the modulated train of optical pulses, recording the measured spectrum as an entry in a spectrogram at a position in the spectrogram corresponding to a relative delay between the modulation and the train of optical pulses, incrementing the relative delay, and repeating the above steps until the accumulated relative delay is equal to the period of the spectrogram. The train of optical pulses and the modulator are then characterized using the measured spectra recorded in the spectrogram.
1. A method, comprising:
a) modulating, using a modulator, a train of optical pulses;
b) measuring a spectrum of said modulated train of optical pulses;
c) recording said measured spectrum as an entry in a spectrogram at a position in said spectrogram corresponding to a relative delay between said modulation and said train of optical pulses;
d) incrementing said relative delay;
e) repeating steps (a), (b), (c), and (d) until the accumulated relative delay is equal to the period of said spectrogram; and
f) characterizing said train of optical pulses and said modulator using said measured spectra recorded in said spectrogram.
2. The method of claim 1 , wherein said spectrogram is constructed using an equation as follows:
S
(
ω
,
τ
)
=
∫
-
∞
+
∞
E
′
(
t
,
τ
)
exp
(
-
ⅈ
ω
t
)
ⅆ
t
2
=
∫
-
∞
+
∞
E
(
t
)
R
(
t
-
τ
)
exp
(
-
ⅈ
ω
t
)
2
wherein ω is the optical frequency, τ is the relative delay between said modulation and said train of optical pulses, E(t) is the electric field of said train of optical pulses, and R(t) is the temporal response function of said modulator.
3. The method of claim 2 , wherein E(t) and R(t) are determined by a two-dimensional blind deconvolution algorithm.
4. The method of claim 3 , wherein said two-dimensional blind deconvolution algorithm is stored in and performed by a characterization control unit.
5. The method of claim 1 , wherein said spectrums are measured using an optical spectrum analyzer.
6. The method of claim 1 , wherein said spectra are measured using a Fabry-Perot etalon followed by a photodetector.
7. The method of claim 1 , wherein said relative delay is incremented by varying a delay to a clock signal coupled to a modulator driver of said modulator, wherein the non-delayed clock signal is also coupled to an optical source generating said train of optical pulses.
8. The method of claim 1 , wherein said relative delay is incremented by varying a delay to a clock signal coupled to an optical source generating said train of optical pulses, wherein the non-delayed clock signal is also coupled to a modulator driver of said modulator.
9. The method of claim 1 , wherein said relative delay is incremented by delaying said train of optical pulses using an optical delay line.
10. The method of claim 1 , wherein a fast photodetector generates a time-varying signal from said train of optical pulses, said signal being operative to drive said modulator.
11. The method of claim 1 , wherein said relative delay is incremented using a delay unit.
12. The method of claim 11 , wherein said delay unit is a programmable phase shifter.
13. The method of claim 1 , wherein said relative delay is incremented in equal intervals until the accumulated relative delay is equal to the period of said spectrogram.
14. An apparatus for characterizing a train of optical pulses and a modulator, comprising:
said modulator, for modulating said train of optical pulses;
a drive unit, for controlling the modulation of said modulator;
a detector, for measuring a spectrum of said train of optical pulses;
a delay unit, for incrementing a relative delay between said modulation and said train of optical pulses; and
a characterization control unit comprising a memory, for storing a spectrogram and program instructions, and a processor for executing said instructions to configure the apparatus to perform the steps of:
a) modulating, using said modulator, said train of optical pulses;
b) measuring a spectrum of said modulated train of optical pulses;
c) recording said measured spectrum as an entry in said spectrogram at a position in said spectrogram corresponding to a relative delay between said modulation and said train of optical pulses;
d) incrementing said relative delay;
e) repeating steps (a), (b), (c), and (d) until the accumulated relative delay is equal to the period of said spectrogram; and
f) characterizing said train of optical pulses and said modulator using said measured spectra recorded in said spectrogram.
15. The apparatus of claim 14 , wherein said spectrogram is constructed using an equation as follows:
S
(
ω
,
τ
)
=
∫
-
∞
+
∞
E
′
(
t
,
τ
)
exp
(
-
ⅈ
ω
t
)
ⅆ
t
2
=
∫
-
∞
+
∞
E
(
t
)
R
(
t
-
τ
)
exp
(
-
ⅈ
ω
t
)
2
wherein ω is the optical frequency, τ is the relative delay between said modulation and said train of optical pulses, E(t) is the electric field of said train of optical pulses, and R(t) is the temporal response function of said modulator.
16. The apparatus of claim 15 , wherein E(t) and R(t) are determined by a two-dimensional blind deconvolution algorithm.
17. The apparatus of claim 16 , wherein said two-dimensional blind deconvolution algorithm is stored in and performed by said characterization control unit.
18. The apparatus of claim 14 , further comprising a fast photodetector that generates from said train of optical pulses a time-varying signal used to control said modulator.
19. The apparatus of claim 18 , wherein said delay unit varies a delay to the signal from said fast photodetector to increment said relative delay.
20. The apparatus of claim 14 , wherein said detector is an optical spectrum analyzer.
21. The apparatus of claim 14 , wherein said detector is a Fabry-Perot etalon followed by a photodetector.
22. The apparatus of claim 14 , wherein said delay unit is a programmable phase shifter.
23. The apparatus of claim 22 , wherein said programmable phase shifter is controlled by said characterization control unit.
24. The apparatus of claim 14 , wherein said relative delay is incremented in equal intervals until the accumulated relative delay is equal to the period of said spectrogram.
25. The apparatus of claim 14 , further comprising a clock for providing a clock signal to an optical source of said train of optical pulses and to said modulator.
26. The apparatus of claim 14 , wherein said modulator is an electro-absorption modulator.
27. An apparatus for characterizing a modulator and a train of optical pulses, wherein said train of optical pulses is modulated by said modulator, comprising:
an optical pulse source, for providing said train of optical pulses to said modulator;
a drive unit, for controlling the modulation of said modulator;
a detector, for measuring a spectrum of said train of optical pulses;
a delay unit, for incrementing a relative delay between said modulation and said train of optical pulses; and
a characterization control unit comprising a memory for storing a spectrogram and program instructions and a processor for executing said instructions to configure the apparatus to perform the steps of:
a) modulating, using a said modulator, said train of optical pulses;
b) measuring a spectrum of said modulated train of optical pulses;
c) recording said measured spectrum as an entry in said spectrogram at a position in said spectrogram corresponding to a relative delay between said modulation and said train of optical pulses;
d) incrementing said relative delay;
e) repeating steps (a), (b), (c), and (d) until the accumulated relative delay is equal to the period of said spectrogram; and
f) characterizing said train of optical pulses and said modulator using said measured spectra recorded in said spectrogram.
28. The apparatus of claim 27 , wherein said spectrogram is constructed using an equation as follows
S
(
ω
,
τ
)
=
∫
-
∞
+
∞
E
′
(
t
,
τ
)
exp
(
-
ⅈ
ω
t
)
ⅆ
t
2
=
∫
-
∞
+
∞
E
(
t
)
R
(
t
-
τ
)
exp
(
-
ⅈ
ω
t
)
2
wherein ω is the optical frequency, τ is the relative delay between said modulation and said train of optical pulses, E(t) is the electric field of said train of optical pulses, and R(t) is the temporal response function of said modulator.
29. The apparatus of claim 28 , wherein E(t) and R(t) are determined by a two-dimensional blind deconvolution algorithm.
30. The apparatus of claim 29 , wherein said two-dimensional blind deconvolution algorithm is stored in and performed by said characterization control unit.
31. The apparatus of claim 27 , further comprising a fast photodetector that generates from said train of optical pulses a time-varying signal used to control said modulator.
32. The apparatus of claim 27 , wherein said delay unit varies a delay to the signal from said fast photodetector to increment said relative delay.
33. The apparatus of claim 27 , wherein said detector is an optical spectrum analyzer.
34. The apparatus of claim 27 , wherein said detector is a Fabry-Perot etalon followed by a photodetector.
35. The apparatus of claim 27 , wherein said delay unit is a programmable phase shifter.
36. The apparatus of claim 35 , wherein said programmable phase shifter is controlled by said characterization control unit.
37. The apparatus of claim 27 , wherein said relative delay is incremented in equal intervals until the accumulated relative delay is equal to the period of said spectrogram.
38. The apparatus of claim 27 , wherein said optical pulse source is any optical light source providing a train of optical pulses.
39. The apparatus of claim 27 , wherein said optical pulse source is a semiconductor laser followed by a modulator.
40. The apparatus of claim 27 , further comprising a clock for providing a clock signal to said optical pulse source and to said modulator.