IP Library Granted Patent US 7,428,337
Granted Patent B2
US 7,428,337 · App. 10/339,433 · Granted Sep 23, 2008

Automatic design of morphological algorithms for machine vision

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Quick Facts
Patent No.
US 7,428,337
App. No.
10/339,433
Granted
Sep 23, 2008
Kind
B2
Abstract

The present invention provides a technique for automated selection of a parameterized operator sequence to achieve a pattern classification task. A collection of labeled data patterns is input and statistical descriptions of the inputted labeled data patterns are then derived. Classifier performance for each of a plurality of candidate operator/parameter sequences is determined. The optimal classifier performance among the candidate classifier performances is then identified. Performance metric information, including, for example, the selected operator sequence/parameter combination, will be outputted. The operator sequences selected can be chosen from a default set of operators, or may be a user-defined set. The operator sequences may include any morphological operators, such as, erosion, dilation, closing, opening, close-open, and open-close.

Claims (40)

1. A method for automated selection of a parameterized operator sequence to achieve a pattern classification task, comprising die steps of:

inputting a collection of labeled data patterns;

deriving statistical descriptions of the inputted labeled data patterns;

determining a criterion function which is used to derive classifier performances by performing the steps of:

determining a classifier performance for each of a plurality of candidate operator sequences and corresponding parameter values using the derived statistical descriptions by performing the steps of:

for each candidate operator sequence and corresponding parameter values, performing:

constructing an Embeddable Markov Chain (EMC), given the derived statistical descriptions for the input data patterns and output statistic to be calculated; and

calculating ouput statistics using the EMC, the output statistics a function of the derived statistical descriptions for the inputted data patterns and a Boolean transformation,

identifying an optimal classifier performance among the determined classifier performances according to specified criteria; and

selecting the operator sequence and corresponding parameter values, associated with the identified optimal classifier performance.

2. The method of claim 1 , further including the step of outputting performance metric information.

3. The method of claim 2 , wherein the outputted performance metric information includes the selected operator sequence and corresponding parameter values.

4. The method of claim 1 , wherein the step of deriving statistical descriptions for input patterns includes deriving the statistical descriptions using a probability model.

5. The method of claim 4 , wherein the probability model is a mixture of Hidden Markov Models (HMMs).

6. The method of claim 4 , wherein the probability model is a Bayesian network.

7. The method of claim 4 , wherein the probability model employs a non-parametric density representation.

8. The method of claim 1 , the inputted collection of data patterns includes at least one of patterns of interest and patterns of non-interest.

9. The method of claim 1 , wherein the plurality of operator sequences includes default operator sequences.

10. The method of claim 1 , wherein the plurality of operator sequences includes operator sequences defined by a user.

11. The method of claim 1 , wherein the specified criteria relates to maximum expected classifier performance.

12. The method of claim 11 , wherein the maximum expected classifier performance relates to balancing the tradeoff between false alarm errors and miss detection errors.

13. The method of claim 1 , wherein the specified criteria are defined by a user.

14. The method of claim 1 , wherein the plurality of operator sequences includes at least one of erosion, dilation, closing, opening, close-open, and open-close.

15. The method of claim 1 , wherein the plurality of operator sequences includes an operator that maps an input Boolean vector to an output Boolcan vector.

16. The method of claim 1 , wherein the plurality of operator sequences includes an operator that is defined as successive application of a 1D filter in two orthogonal directions.

17. The method of claim 1 , wherein the inputted collection of data patterns includes gray-level data transformed to a binary representation.

18. The method of claim 1 , wherein the inputted collection of data patterns includes color data transformed to a binary representation.

19. The method of claim 1 , wherein the step of constructing an EMC comprises the steps of:

(a) constructing a state space;

(b) building a state-transition graph with associated state-transition probabilities for the candidate operator sequence; and

(c) partitioning the state-space.

20. A method for determining optimal classifier performance of a plurality of candidate operator sequences and corresponding parameter values, comprising the steps of:

for each candidate operator sequence and corresponding parameter values, performing:

(a) constructing an Embeddable Markov Chain(EMC), given statistical descriptions for inputted data patterns and output statistic to be calculated;

(b) calculating the output statistics using the EMC; and

(c) selecting an optimal operator sequence and corresponding parameter values using the output statistics, according to specified criteria.

21. The method of claim 20 , wherein the step of constructing an EMC comprises the steps of:

a) constructing a state space;

b) building a state-transition graph with associated state-transition probabilities for the candidate operator sequence; and

c) partitioning the state-space.

Assignments (3)
MERGER Recorded Apr 5, 2010
From: SIEMENS CORPORATE RESEARCH, INC.
To: SIEMENS CORPORATION
Reel/Frame 024185/0042 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 13, 2003
From: BOULT, TERRANCE E.
To: SIEMENS CORPORATE RESEARCH, INC.
Reel/Frame 014049/0953 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 13, 2003
From: GAO, XIANG; RAMESH, VISVANATHAN
To: SIEMENS CORPORATE RESEARCH, INC.
Reel/Frame 014050/0577 →