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App. No. 10/351,204 · Confirmation No. 3560

Method and device generating integrated circuit test programs

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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2006-08-10 ABN Abandonment 2 View
2005-08-18 FRPR Certified Copy of Foreign Priority Application 28 View
2005-07-28 CTNF Non-Final Rejection 13 View
2005-07-28 892 List of references cited by examiner 1 View
2005-07-28 SRFW Search information including classification, databases and other search related notes 1 View
2005-07-28 FWCLM Index of Claims 1 View
2005-07-28 BIB Bibliographic Data Sheet 1 View
2005-07-22 SRNT Examiner's search strategy and results 2 View
2003-05-19 PEFR Applicant Response to Pre-Exam Formalities Notice 2 View
2003-05-19 OATH Oath or Declaration filed 4 View
2003-03-13 PEFN Pre-Exam Formalities Notice 1 View
2003-01-24 TRNA Transmittal of New Application 3 View
2003-01-24 SPEC Specification 12 View
2003-01-24 CLM Claims 2 View
2003-01-24 ABST Abstract 1 View
2003-01-24 DRW Drawings-only black and white line drawings 1 View
2003-01-24 WFEE Fee Worksheet (SB06) 1 View
2003-01-24 WFEE Fee Worksheet (SB06) 1 View
2003-01-24 WCLM Claims Worksheet (PTO-2022) 1 View
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Quick Facts
App. No.
10/351,204
Filed
2003-01-24
Pub. No.
US20030177426A1
Art Unit
2138