IP Library Granted Patent US 6,879,440
Granted Patent B2
US 6,879,440 · App. 10/355,868 · Granted Apr 12, 2005

Autofocus module and method for a microscope-based system

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Quick Facts
Patent No.
US 6,879,440
App. No.
10/355,868
Granted
Apr 12, 2005
Kind
B2
Abstract

An autofocus module for a microscope-based system includes at least two light sources, each of which generates a light beam for focusing. An optical directing device is provided that directs a respective portion of each light beam onto an incoupling means, which couples each of the light beams into the illuminating light beam of the microscope-based system and directs the light beams onto a specimen. A first and a second detector receive the light beams of the first and second light source reflected from the surface of the specimen, and ascertain the intensities on the first and second detector in time-multiplexed fashion.

Claims (47)

1. An autofocus module for a microscope-based system, comprising:

a first light source configured to generate a first light beam for focusing;

a second light source configured for generating a second light beam for focusing;

an optical directing device configured to direct a respective portion of each of the first and second light beams onto an incoupling device, the incoupling device being configured to couple the respective portion of each of the first and second light beams into an illuminating light beam of the microscope-based system and direct the respective portion of each of the first and second light beams onto a specimen, the illuminating light beam being perpendicular to a surface of the specimen and propagating along an optical axis defined by an objective of the microscope-based system;

a first detector configured to receive a third light beam of only the first light source, the third light beam being reflected from the specimen; and

a second detector configured to receive a fourth light beam of only the second light source, the fourth light beam being reflected from the specimen.

2. The autofocus module as recited in claim 1 wherein the optical directing device includes a prism disposed so that the respective portion of the first light beam is directed into a first half of the illuminating light beam and the respective portion of the second light beam is directed into a second half of the illuminating light beam.

3. The autofocus module as recited in claim 1 wherein the optical directing device includes a first mirror-coated element configured to direct the respective portion of the first light beam and a second mirror-coated element configured to direct the respective portion of the second light beam, the first and second minor-coated elements being disposed at right angles to one another and inclined at a 45° angle to the incident respective portion of the first and second light beams.

4. The autofocus module as recited in claim 1 further including a beam deflection device, and wherein the first and the second light sources, the first and the second detectors, the optical directing device and the beam deflection device are disposed in a housing connectable to the microscope-based system.

5. The autofocus module as recited in claim 1 wherein each of the first and second light sources includes a respective laser diode.

6. The autofocus module as recited in claim 1 wherein the first and the second light sources, the first and the second detectors and the optical directing device are disposed in a housing connectable to the microscope-based system via a flange.

7. The autofocus module as recited in claim 1 wherein the microscope-based system includes a dichroic beam splitter configured to couple the first and second light beams into the microscope-based system and to couple the third and fourth light beams back into the autofocus module.

8. The autofocus module as recited in claim 1 wherein each of the first and the second detectors includes a respective matrix of photosensitive elements.

9. The autofocus module as recited in claim 1 wherein each of the first and second detectors includes a respective position-sensitive detector.

10. A microscope system comprising:

an objective defining an optical axis perpendicular to a surface of a specimen;

a stage configured to support the specimen and displaceable in a direction of the optical axis; and

an autofocus module including:

a first light source configured to generate a first light beam for focusing;

a second light source configured for generating a second light beam for focusing;

an optical directing device configured to direct a respective portion of each of the first and second light beams onto an incoupling device, the incoupling device being configured to couple the respective portion of each of the first and second light beams into an illuminating light beam of the microscope-based system and direct the respective portion of each of the first and second light beams onto the specimen, the illuminating light beam being perpendicular to a surface of the specimen and propagating along the optical axis;

a first detector configured to receive a third light beam of only the first light source, the third light beam being reflected from the specimen; and

a second detector configured to receive a fourth light beam of only the second light source, the fourth light beam being reflected from the specimen.

11. The microscope system as recited in claim 10 further comprising a dichroic beam splitter mounted in an autofocus module mounting element of the microscope system and configured to couple the first and second light beams into the microscope-based system and to couple the third and fourth light beams back into the autofocus module.

12. The microscope system as recited in claim 10 wherein the optical directing device includes a prism disposed so that the respective portion of the first light beam is directed into a first half of the illuminating light beam and the respective portion of the second light beam is directed into a second half of the illuminating light beam.

13. The microscope system as recited in claim 10 wherein the optical directing device includes a first mirror-coated element configured to direct the respective portion of the first light beam and a second mirror-coated element configured to direct the respective portion of the second light beam, the first and second mirror-coated elements being disposed at right angles to one another and inclined at a 45° angle to the incident respective portion of the first and second light beams.

14. The microscope system as recited in claim 10 wherein each of the first and second light sources includes a respective laser diode.

15. The microscope system as recited in claim 10 wherein each of the first and the second detectors includes a respective matrix of photosensitive elements.

16. The microscope system as recited in claim 10 wherein each of the first and second detectors includes a respective position-sensitive detector.

17. A method for autofocusing a microscope-based system, the microscope-based system including at least one objective defining an optical axis of the microscope-based system, the method comprising:

displacing a specimen in a direction of the optical axis and in a vicinity of a region that includes an optimum focal position;

alternatingly generating a first light beam using a first light source and a second light beam using a second light source;

directing a respective portion of each of the first and second light beams onto a surface of the specimen using an optical directing device;

receiving on a first detector light of only the first light source reflected from the surface of the specimen;

receiving on a second detector light of only the second light source reflected from the surface of the specimen; and

determining the optimum focal position using intensities measured on the first and second detectors.

18. The method as recited in claim 17 further comprising:

alternately determining a respective intensity at the first and second detectors during the displacing of the specimen so as to determine the measured intensities; and

storing the measured intensities as intensity profiles in a memory of a control computer.

19. The method as recited in claim 18 wherein the determining the optimal focal position is performed by determining the measured intensities or intensity profiles that come closest to a criteria for the optimum focal position.

20. The method as recited in claim 17 wherein the optical directing device includes a prism, and wherein the directing is performed, using the prism, so that the respective portion of the first light beam is directed into a first half of an illuminating light beam and the respective portion of the second light beam is directed into a second half of an illuminating light beam.

21. The method as recited in claim 20 wherein the optical directing device includes a first minor-coated element configured to direct the respective portion of the first light beam and a second mirror-coated element configured to direct the respective portion of the second light beam, the first and second mirror-coated elements being disposed at right angles to one another and inclined at a 45° angle to the incident respective portion of the first and second light beams.

22. The method as recited in claim 20 further comprising disposing a beam deflection device, the first and the second light sources, the first and the second detectors and the optical directing device in a housing connectable to the microscope-based system.

23. The method as recited in claim 22 wherein the microscope-based system includes a dichroic beam splitter configured to couple the first and second light beams into the microscope-based system and to couple the third and fourth light beams back into the autofocus module.

24. The method as recited in claim 17 wherein each of the first and second light sources includes a respective laser diode.

25. The method as recited in claim 17 wherein each of the first and the second detectors includes a respective matrix of photosensitive elements.

26. The method as recited in claim 17 wherein each of the first and second detectors includes a respective position-sensitive detector.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2005
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 016536/0330 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2003
From: CEMIC, FRANZ; DANNER, LAMBERT; MAINBERGER, ROBERT; VEITH, MICHAEL; OSTERFELD, MARTIN; GRAF, UWE
To: LEICA MICROSYSTEM SEMICONDUCTOR GMBH
Reel/Frame 013726/0553 →