No-flow underfill process and material therefor
A no-flow underfill material and process suitable for underfilling a bumped circuit component. The underfill material initially comprises a dielectric polymer material in which is dispersed a precursor capable of reacting to form an inorganic filler. The underfill process generally entails dispensing the underfill material over terminals on a substrate, and then placing the component on the substrate so that the underfill material is penetrated by the bumps on the component and the bumps contact the terminals on the substrate. The bumps are then reflowed to form solid electrical interconnects that are encapsulated by the resulting underfill layer. The precursor may be reacted to form the inorganic filler either during or after reflow.
1. A method of underfilling a bumped circuit component with a no-flow underfill material, the method comprising the steps of:
forming the no-flow underfill material to comprise a dielectric polymer material containing a precursor, the underfill material being substantially free of an inorganic filler;
dispensing the underfill material over terminals on a substrate;
penetrating the underfill material with bumps on the circuit component so that the bumps contact the terminals;
heating the bumps so that the bumps melt; and then
cooling the molten bumps so that the molten bumps form solid electrical interconnects that are metallurgically bonded to the terminals, the underfill material forming an underfill layer that encapsulates the interconnects and contacts both the circuit component and the substrate;
wherein the precursor is reacted to form an inorganic filler having a CTE lower than the CTE of the dielectric polymer material.
2. The method according to claim 1 , wherein the precursor is an organometallic silicon compound and the inorganic filler comprises silica particles.
3. The method according to claim 2 , wherein at least some of the silica particles are nano-particles.
4. The method according to claim 1 , wherein the precursor is reacted to form the inorganic filler during the heating step.
5. The method according to claim 1 , wherein the precursor is reacted to form the inorganic filler during a second heating step performed after the cooling step.
6. The method according to claim 5 , wherein the dielectric polymer material is cured during the second heating step.
7. The method according to claim 1 , wherein the dielectric polymer material is cured during the heating step.
8. A method of underfilling a flip chip die with a no-flow underfill material, the method comprising the steps of:
forming the no-flow underfill material to comprise an uncured polymer adhesive material in which an organometallic silicon compound is dispersed, the underfill material being substantially free of an inorganic filler having a OTE lower than the CTE of the adhesive material;
dispensing the underfill material over terminals on an organic laminate substrate;
penetrating the underfill material with solder bumps on the circuit component so that the solder bumps contact the terminals and the underfill material completely fills a space defined by and between the die and the substrate;
heating the solder bumps so that the solder bumps melt; and then
cooling the molten solder bumps so that the molten solder bumps form solid solder connections that are metallurgically bonded to the terminals, the underfill material forming an underfill layer that encapsulates the solder connections and completely fills a space defined by and between the die and the substrate;
wherein the organometallic silicon compound is thermally decomposed to form an inorganic filler comprising silica nano-particles.
9. The method according to claim 8 , wherein the organometallic silicon compound is reacted to form the inorganic filler during the heating step.
10. The method according to claim 8 , wherein the precursor is reacted to form the inorganic filler during a second heating step performed after the cooling step.
11. The method according to claim 8 , wherein the adhesive material is cured during the second heating step.
12. The method according to claim 8 , wherein the adhesive material is cured during the heating step.
13. A no-flow underfill material comprising a dielectric polymer material and a precursor, the underfill material being substantially free of an inorganic filler, the precursor being capable of reacting to form an inorganic filler having a CTE lower than the CTE of the dielectric polymer material.
14. The no-flow underfill material of claim 13 , wherein the underfill material covers terminals on a substrate.
15. The no-flow underfill material of claim 14 , wherein the underfill material is penetrated by bumps on a circuit component so that the bumps contact the terminals and the underfill material completely fills a space defined by and between the circuit component and the substrate.
16. The no-flow underfill material of claim 15 , wherein the substrate is an organic laminate substrate.
17. The no-flow underfill material of claim 13 , wherein the precursor is an organometallic silicon compound and, if the underfill material is sufficiently heated, the precursor reacts to form silica nano-particles dispersed within the underfill material.
18. The no-flow underfill material of claim 13 , wherein the dielectric polymer material is an epoxy adhesive material.
19. A no-flow underfill layer between a flip chip die and an organic laminate substrate, the die being attached to the substrate with solder connections bonded to terminals on the substrate, the underfill layer comprising silica nano-particles dispersed in an adhesive material, the underfill layer encapsulating the solder connections and completely filling a space defined by and between the die and the substrate, wherein said silica nano-particles are formed from the reaction of a dielectric polymer material and a precursor mixture which is substantially free of an inorganic filler.
20. The no-flow underfill layer of claim 19 wherein, other than the silica nano-particles, the underfill layer is tree of an inorganic filler having a CTE lower than the CTE of the adhesive material.